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A method of mura defect detection based on machine vision

A defect detection and machine vision technology, applied in instruments, nonlinear optics, optics, etc., can solve the problems of in-depth research on imaging systems, long time, and high detection complexity, and achieve reasonable parameter design, avoid fatigue, and robustness. Good results

Active Publication Date: 2020-09-25
CAS OF CHENGDU INFORMATION TECH CO LTD
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Problems solved by technology

[0006] The purpose of the present invention is to provide a fast and robust method for online detection of Mura defects for the problems of high detection complexity, long time, and in-depth research on imaging systems in the prior art.

Method used

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  • A method of mura defect detection based on machine vision
  • A method of mura defect detection based on machine vision
  • A method of mura defect detection based on machine vision

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Embodiment

[0042] According to the attached figure 2 In the steps in the detection system of the present invention, such as image 3 The collected image I.

[0043] In this embodiment, the specific steps of the detection method of Mura defect detection based on machine vision are:

[0044] S1. Image acquisition: the linear CCD camera collects the gray image I of the LCD screen and transmits it to the defect detection and processing equipment; image 3 Shown

[0045] S2, preprocessing: use gradient threshold edge detection method for the LCD screen image I to obtain the edge of the LCD screen, segment by edge to obtain the LCD screen image P to be detected; use the 3*3 template size to perform Gaussian on the LCD screen image P Blur, get the image S to be processed;

[0046] S3. Background elimination: For image S, use the background elimination method based on domain information of Formula 1 to obtain the foreground image M: Figure 4 Shown

[0047] M(x,y)=|S(x+Δd,y)+S(x-Δd,y)+S(x,y+Δd)+S(x,y-Δd...

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Abstract

The invention belongs to the technical field of liquid crystal screen display defect detection, and specifically relates to a method and a system for detecting Mura defects based on machine vision. The detection system comprises linear array CCD cameras (1), a line light source (2), a liquid crystal screen (3), a liquid crystal screen conveyer (4), and an image defect detection device (5). Compared with average overall pixel calculation in a spatial domain background separation method and a shadow elimination method based on a Gaussian mixture model, the detection method just uses local area calculation, standard is not needed to be established, and calculation amount is low. The method prevents errors caused by overall calculation under the condition that light is not uniform in an imaging process. The method has linear time complexity, and robustness is good, and parameter design is reasonable and artificial intervention is little. The method and the system are high in efficiency, and are suitable for industrial detection.

Description

Technical field [0001] The invention belongs to the technical field of liquid crystal screen display defect detection, and particularly relates to a Mura defect detection method based on machine vision. Background technique [0002] In recent years, as LCD screens are widely used in personal computers, desktop monitors, LCD TVs, handheld devices such as mobile phones, mobile devices such as car displays, and other products, their demand has shown explosive growth. Especially in the past two years, the resolution of LCD screens has continued to increase, especially the gradual popularity of retina-level LCD screens, consumer experience requirements have become increasingly demanding, competition among LCD screen manufacturers has become increasingly fierce, and the demand for sub-pixel defect detection has become increasingly prominent. , Plays an increasingly important role in the quality control of LCD screens. [0003] Since the current inspections in this industry mainly rely o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/13
CPCG02F1/1309
Inventor 钱基德钱基业陈斌王佐才陈刚吴强李科张衡
Owner CAS OF CHENGDU INFORMATION TECH CO LTD
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