dram testing device and method

Abstract

A DRAM testing device, comprising a test frame for inserting a DRAM to be tested, a program storage module for storing a test program, a current test module and a test control module, and the test control module receives a test switch command to perform a current test on the DRAM to be tested And function test and upload the test results. By setting the test control module and reading the pre-stored test program to complete the function test of DRAM, you can also control the current test module to perform current test on the DRAM loading voltage, and set up a low-cost independent module. Test to pick out defective products to achieve maximum efficiency.

Description

technical field [0001] The invention belongs to the field of memory device testing, and in particular relates to a low power consumption DRAM testing device and method. Background technique [0002] At present, the test of DRAM (Dynamic Random Access Memory, dynamic random access memory) mainly relies on the test of the machine, including T5588 and T5503A and other machines, to test the relevant parameters of LPDDR2 / 3, these machines can be tested at a high temperature of 88 ℃ The test is carried out under the conditions, and the feeding material can range from 128 to 256 at a time. The robot is used to grab and classify the chips, but the machine test method is expensive and inflexible. [0003] In addition to the machine test, there is also a whole machine test plan. The DRAM test seat is directly added to the original welded DRAM package on the whole machine to achieve the purpose of testing. The whole machine test plan installs the complete DRAM test socket on this modu...

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a platform-based DRAM testing device and method, aiming to solve the problem that the testing method in the traditional technical solution has high cost and cannot test specific parameters alone

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