Silicon epitaxial wafer production process of 8-inch power chip
A technology of silicon epitaxial wafer and production process, which is applied in the directions of crystal growth, single crystal growth, single crystal growth, etc., can solve the problems affecting the popularization and application of silicon epitaxial wafers, inconvenient silicon epitaxial wafer resistivity uniformity, doping, etc. Achieve the effect of reducing the self-dilution effect of impurities, improving uniformity and reducing the concentration of self-doping impurities
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Embodiment 1
[0040] Such as figure 1 As shown, the silicon epitaxial wafer production process for 8-inch power chips includes the following steps in sequence: step 1, the silicon substrate material is cleaned with pure water and then placed in the reactor; step 2, hydrogen is used as the carrier gas to discharge The air in the reactor; step 3, raise the temperature inside the reactor to 1160°C, then use HCL to etch for 4 minutes, and then remove the HCL inside the reactor; step 4, lower the temperature inside the reactor to the growth temperature of 1025°C Step 5, feed silane and dopant into the reactor, so that the surface of the silicon substrate generates a silicon single crystal layer, and obtain a silicon epitaxial wafer; Step 6, stop feeding the reaction gas into the reactor, and wait for the reactor inside to drop When the temperature reaches room temperature, nitrogen gas is introduced into the reactor for 3-4 minutes; step 7, the reactor is opened to take out the silicon epitaxial...
Embodiment 2
[0048] The difference between this example and Example 1 is that in this example, in step 3, the temperature inside the reactor was raised to 1180° C., HCL was etched for 3 minutes, and in step 4, the temperature inside the reactor was lowered to 1020° C. In this embodiment, when the epitaxial layer is grown, the resistivity uniformity is less than 6%.
Embodiment 3
[0050] The difference between this example and Example 1 is that in this example, in step 3, the temperature inside the reactor was raised to 1170° C., HCL was etched for 3.5 minutes, and in step 4, the temperature inside the reactor was lowered to 1030° C. In this embodiment, when the epitaxial layer is grown, the resistivity uniformity is less than 6%.
[0051] Further, please refer to image 3 , the horizontal reactor is provided with a radio frequency coil adjustment structure, and the radio frequency coil adjustment structure includes:
[0052] The first fixed ring 11, the second fixed ring 12, two pulleys 13, and the cross bar 14; the outer surface of the reactor is provided with a chute, the pulleys are embedded in the chute, and the first fixed ring and the second fixed ring are both set Set on the outer surface of the reactor, the first fixed ring and the second fixed ring are slidingly connected to the reactor through pulleys respectively. The cross bar is made of e...
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