Error analysis method based on vision stitching measurement
An error analysis and error technology, which is applied in the field of error analysis based on visual stitching measurement, and can solve problems such as unexplained quantitative influence relationships.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0054] Example 1, first set up as attached figure 1 The laser tracker-based binocular vision splicing measurement system shown above uses Leica AT960 MR as the measuring head 8 of the laser tracker, and the measurement range is 1‐20m. The left camera 3 and the right camera 5 use VC-12MC-M, with a resolution of 3072*4096 and a maximum frame rate of 60Hz. And use the checkerboard to calibrate the binocular vision system, the obtained camera calibration parameters are as follows: the coordinate value of the principal point of the left camera u 01 = 2140.397824, v 01 =1510.250152; equivalent focal length f x1 =6447.987913, f y1 =6454.015281; the coordinate value of the principal point of the right camera u 02 = 2124.090030, v 02 =1526.184441, equivalent focal length f x2 =6417.044403, f y2 =6420.363610, and the transformation matrix from the left camera to the right camera Arrange 9 public points in the public field of view of the laser tracker and the visual measurement ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com