Granary material level detection device

Abstract

The invention relates to the technical field of electronic detection, in particular to a granary material level detection device which includes a main control module, a photoresistor circuit module, acommunication module, a display module, an alarm module and a power module. The main control module uses an ATmega128 single-chip microcomputer as a core, and the photoresistor circuit module includes eight analog multiplex switch chips 74HC4067. The photoresistor circuit module includes a reference resistor and a photoresistor, the communication module includes SPI, 485, and TTL serial port interface circuits, and the display module uses a serial port LCD screen. According to the granary material level detection device, through the use of the photoresistor as a non-contact switch, rules fordevice installation, wiring and inspection are formulated, a series of reliable data detection measures for hardware and software are adopted, and a dual-unit joint detection method based on the device is proposed. Granary grain storage security is greatly ensured, and the granary material level detection device has great practical and application value.

Description

technical field [0001] The invention relates to the technical field of electronic detection, in particular to a granary material level detection device. Background technique [0002] In the field of grain monitoring and control, grain management units often need to measure the height information (ie material level) of the grain in the warehouse in order to timely and accurately grasp the amount of grain stored in the granary. Therefore, the material level of the granary is one of the key technologies in the field of grain monitoring. The existing material level measuring devices mainly have two types: contact type and non-contact type. In the contact measuring device: some use a method of installing a rotary material level switch at the top and bottom of the granary to judge whether the granary is full or empty, but cannot measure the limit state between the two. accurate grain height information between Some use contact switches to detect the material level. Although the...

AI Technical Summary

Problems solved by technology

Infrared level gauge is easily interfered by other external light sources

Although the radar meter has high measurement accuracy and strong anti-interference ability, its price is too high, which is not conducive to large-scale promotion

Some use a non-contact switch to detect the material level. The non-contact switch does not come into direct contact with the grain, and the grain will not be damaged by adhesion, extrusion, wear, etc., but it is easily affected by the surrounding temperature and surrounding objects.

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