Method for detecting uneven thickness defect of exterior grid line of battery piece

A defect detection and cell technology, applied in measuring devices, using electrical devices, using electromagnetic means, etc., can solve problems such as lowering product quality, fatigue, and uneven thickness of grid lines on the surface of solar cells

Active Publication Date: 2018-02-27
HEBEI UNIV OF TECH +1
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Problems solved by technology

[0003] At present, the main detection method for defects of uneven grid line thickness on the surface of solar cells is still manual sampling inspection, and the application of machine vision in China is not yet mature.
Manual inspection relies on naked eye judgment and has great subjective consciousness. Since the grid line is relatively slender, long-term human eye inspection will inevitably cause fatigue, resulting in an increase in missed detection rate and false detection rate, and lower product quality.

Method used

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  • Method for detecting uneven thickness defect of exterior grid line of battery piece

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Embodiment Construction

[0024] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0025] refer to figure 1 as shown, figure 1 It is a flow chart of the defect detection method of the present invention. The present invention claims a method for detecting defects of uneven grid line thickness on the appearance of a cell. The method includes three step units,

[0026] The first step, image preprocessing unit

[0027] 1-1. Obtain HSI channel image: convert the RGB image collected by the industrial camera into an HSI channel image, and take th...

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Abstract

The invention provides a method for detecting the uneven thickness defect of an exterior grid line of a battery piece. According to the method, the process is divided into three parts, the first partis that an image preprocessing unit acquires vertical discontinuous grid line information, the second part is that a curve fitting unit fits the average value of each line of the grid line, and the third part is that a grid line uneven thickness defect detection unit conducts judgment and detection by using the difference value of an image array and a fitted curve.

Description

technical field [0001] The invention relates to the technical field of photovoltaic cell detection, and mainly relates to a method for detecting defects of uneven thickness of grid lines on the appearance of polycrystalline silicon cells. Background technique [0002] Due to its clean and pollution-free features, solar energy has gradually occupied an important proportion in the energy industry. China is one of the countries with abundant solar energy resources, and the demand for photovoltaic industry will further increase in the future. In order to improve the conversion efficiency of solar energy, solar cells are an important part of the power generation process, and its quality is particularly important. During the processing and preparation of solar cells, cumbersome production technology, high-quality production technology, and the fragility and thinness of silicon cells make solar cells prone to various defects. These defects affect the battery life and power generat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G01B7/02
CPCG01B7/02G06T7/0004G06T2207/10004G06T2207/30148
Inventor 陈海永庞悦韩江锐李帅赵慧芳刘坤于矗卓樊雷雷胡洁王玉崔海根
Owner HEBEI UNIV OF TECH
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