MCU-based multi-channel optical module automatic test device and method

An automatic test device and multi-channel technology, applied in the field of optical modules, can solve the problem that the size of the backlight current cannot truly reflect the optical power, and achieve the effect of reducing production and testing links, improving product quality and good stability.

Pending Publication Date: 2018-03-06
CHENGDU GANIDE TECH
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AI Technical Summary

Problems solved by technology

[0003] The technical problem to be solved by the present invention is to provide an MCU-based multi-channel optical module automatic testing device and method to solve the problem that the size of the backlight current generated by the detection of the backlight diode cannot truly reflect the optical power

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  • MCU-based multi-channel optical module automatic test device and method
  • MCU-based multi-channel optical module automatic test device and method

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Embodiment Construction

[0022] The principles and features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.

[0023] Such as figure 1 As shown, a multi-channel optical module automatic test device based on MCU, including MCU, PC, driver, laser, multi-channel optical power meter, sampling oscilloscope and bit error meter, PC is connected to MCU through USB, PC also Connect to the bit error meter, multi-channel optical power meter and sampling oscilloscope respectively, the bit error meter transmits the differential signal to the driver, the driver serial bus is connected to the AD conversion pin of the MCU, the driver is also connected to the laser, and the light emitted by the laser passes through the lens Couple to an optical fiber to form a launch multichannel, and connect the launch multichannel to a multichannel optical...

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Abstract

The invention relates to an MCU-based multi-channel optical module automatic testing device, including MCU, PC, driver, laser, multi-channel optical power meter, sampling oscilloscope and bit error meter, the PC is connected to the MCU through USB, and the PC is connected to the MCU. They are respectively connected to the bit error meter, multi-channel optical power meter and sampling oscilloscope. The bit error meter transmits the differential signal to the driver. The driver is connected to the MCU through the serial bus. The driver is also connected to the laser. The light emitted by the laser is coupled to the optical fiber through the lens. A launch multi-channel is formed, and the launch multi-channel is connected with a multi-channel optical power meter or a sampling oscilloscope. The invention uses an automatic testing method to enhance the consistency of the multi-channel optical power and extinction ratio at the full temperature of the optical module, improve the stability, improve product quality, reduce production and testing links, reduce manpower, and improve efficiency.

Description

technical field [0001] The invention relates to the technical field of optical modules, in particular to an MCU-based multi-channel optical module automatic testing device and method. Background technique [0002] Average optical power and extinction ratio are important technical indicators in optical modules, and different customers have different setting requirements for optical power and extinction ratio. According to the working principle of the laser, adjusting the bias current and modulation current supplied to the laser can adjust the average power and extinction ratio. In the case of a single channel or a small number of channels in the past, the APC closed-loop control method is used to adjust the bias current by detecting the backlight current generated by the backlight diode, so as to achieve the effect of stabilizing the optical power. The magnitude of the modulation current can be determined by means of temperature compensation. However, in the application of ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B10/079
Inventor 张庆成林都督王栋卢朝保赵家闯陈依军吕继平童伟
Owner CHENGDU GANIDE TECH
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