A power capacitor test bench

Abstract

The invention discloses a power capacitor experiment table comprising a base which is internally provided with a device cavity. The upper end of the base is provided with a worm rod. The worm rod penetrates through the side wall of the base and extends into the device cavity. One end of the worm rod is rotatably connected on the internal wall of the device cavity, and the other end of the worm rodis provided with a rotating wheel. The device cavity is internally provided with a worm gear. One end of the worm gear is rotatably connected on the side wall of the device cavity. One end, which isaway from the internal wall of the device cavity, of the worm gear is provided with a cylinder. The internal wall of an output groove is provided with a bar groove. The power capacitor experiment table is reasonable in structural design and easy to operate so that the labor intensity of the worker can be effectively reduced, the working efficiency can be enhanced and the power capacitor test capability can also be enhanced.

Description

technical field [0001] The invention relates to the technical field of capacitor testing, in particular to a power capacitor test bench. Background technique [0002] At present, the power capacitor test device is to perform electrical performance withstand voltage test and dielectric loss test on a single capacitor. The whole process is as follows: [0003] 1 The product is on the track and reaches the test area; [0004] 2 Connect the upper electrode of the capacitor with a cable, and conduct a withstand voltage test and a dielectric loss test on the capacitor through the test system; [0005] 3 The product leaves the test area and arrives at the next process paint line; [0006] The above-mentioned disadvantages of this kind of test device are as follows: [0007] 1 Only a single power capacitor can be tested; [0008] 2 The contact resistance between the upper electrode of the capacitor and the cable clamp is too large, and the temperature is too high. When measuring...

AI Technical Summary

Problems solved by technology

[0007] 1 Only a single power capacitor can be tested;

[0008] 2 The contact resistance between the upper electrode of the capacitor and the cable clamp is too large, and the temperature is too high. When measuring the withstand voltage and dielectric loss of the capacitor, the product measurement is inaccurate, and the unqualified product flows into the next process, causing the product to appear during operation. electrical failure or accident;

[0009] 3 The operator is inconvenient to operate, the test ability cannot be improved, and the operator often enters and exits the test area, which will cause harm to the human body due to the action of the electric field;

[0010] 4 Using this method to test the electrical performance of capacitors, the product testing ability is low, and the work efficiency of operators is reduced, resulting in too much product backlog, which cannot meet the subsequent procedures. In order to solve this test bottleneck, how to improve the capacitor testing ability can be effectively It is a technical problem to be solved by those skilled in the art to solve the electrical performance test of a single power capacitor

Images