Defect measurement method, defect measurement device and inspection probe

A measurement method and defect technology, applied in the field of inspection probes, can solve problems such as quantitatively measuring the depth of defects, and achieve the effect of rapid quantitative evaluation

Active Publication Date: 2021-03-30
SUMITOMO CHEM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0009] However, in the magnetization eddy current flaw detection test and the leakage flux method, although the presence or absence of defects can be inspected, there is a problem that the depth of defects cannot be quantitatively measured with high accuracy.

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  • Defect measurement method, defect measurement device and inspection probe
  • Defect measurement method, defect measurement device and inspection probe
  • Defect measurement method, defect measurement device and inspection probe

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Embodiment Construction

[0034] In this specification, a magnetic member means a member made of a magnetic body, and examples thereof include cables, wires, plate-like members, various structures, and the like made of a magnetic body. Moreover, as a defect of a magnetic body member, the defect of a thin-walled shape (henceforth called a thin-walled thing), the defect of a crack shape, etc. are mentioned. In addition, the thinning of the wall thickness refers to a phenomenon in which the thickness is thinned due to mechanical wear, chemical corrosion, and the like.

[0035] One embodiment of the present invention will be described. In this embodiment, an example in which a magnetic tube is used as an inspection object as a magnetic member, a Hall element is used as a magnetic sensor, and an excitation / detection coil is used as an eddy current flaw detection sensor is described to inspect the thinning of the wall. , but the application object of the present invention is neither limited to magnetic tube...

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Abstract

The present invention provides a defect measurement method, a defect measurement device and an inspection probe, which can quickly perform quantitative evaluation of defects in magnetic components. A Hall element (11) equipped with a third magnet (4) polarized in a direction intersecting the opposing surface of the magnetic component and a Hall element (11) that detects the magnetic flux density passing through the third magnet (4) and the magnetic component is used. The inspection probe (100) applies an evaluation algorithm selected according to whether the defective surface is the front surface or the back surface to the output signal of the Hall element (11).

Description

technical field [0001] The present invention relates to a defect measurement method and a defect measurement device for measuring a defect of a component made of a magnetic body, and an inspection probe used for the measurement of the defect. Background technique [0002] Conventionally, magnetization eddy current testing (magnetization ECT (Eddy Current Testing)) disclosed in Patent Document 1 and the like is known as an inspection method for inspecting the presence or absence of defects such as thickness reduction and cracks in magnetic components, A magnetic flux leakage method (MFL; Magnetic Flux Leakage) disclosed in Patent Document 2 and the like. [0003] In addition, an immersion rotary ultrasonic thickness measurement method (IRIS; Internal Rotary Inspection Systems, Internal Rotary Inspection Systems) is known as a method for quantitatively measuring the depth of defects in magnetic components. [0004] prior art literature [0005] patent documents [0006] Pat...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N27/82G01N27/90G01N27/9013
CPCG01N27/82G01N27/902G01N27/90
Inventor 多田丰和末次秀彦
Owner SUMITOMO CHEM CO LTD
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