On-line test system and method for radiating effect of CMOS single-chip microcomputer 80C196

Abstract

In order to solve the technical problem that the complex structure of the single-chip microcomputer 80C196 and the limited external pins result in that the radiating effect test cannot cover all the internal functional modules of the single-chip microcomputer 80C196. The present invention provides an on-line test system and method for the radiating effect of the CMOS single-chip microcomputer 80C196. First of all, a single-chip microcomputer 80C196 under test is subjected to functional module division, and each functional module has corresponding electrical parameters or functional parametersfor representation to monitor the working status of each functional module; then the electrical parameters and functional parameters of each functional module are diagnosed and analyzed, and the single-chip microcontroller 80C196 electrical parameter and functional failures caused by the radiating effect are defined in the single-chip microcontroller's internal functional modules. The system and method can meet the test requirement of the single-chip 80C196 radiating effect.

Description

technical field [0001] The invention relates to an online test system and method for the radiation effect of a single-chip microcomputer 80C196 in CMOS technology. Background technique [0002] Single-chip microcomputer is one of the core devices used in electronic systems of satellites, spacecraft, and strategic weapons. It integrates the basic functions of computers and has the characteristics of small size, low power consumption, fast speed, and high reliability. processing has a wide range of applications. In practical applications, single-chip microcomputers are very sensitive to rays and particles. When they are damaged by radiation and particles in nuclear and space radiation environments, the electrical parameters and functions of single-chip microcomputers will degrade or even fail, which seriously threatens the reliability of single-chip microcomputers. operation. Therefore, the experimental measurement and mechanism analysis of the radiation effect of single-chip...

AI Technical Summary

Problems solved by technology

[0005] In order to solve the technical problem that the structure and function of single-chip microcomputer 80C196 is complex and the external pins are limited, which makes it difficult for the radiation effect test to cover all internal functional modules of single-chip microcomputer 80C196, the present invention provides an online test system and method for the radiation effect of single-chip microcomputer 80C196 with CMOS technology

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