Precise tester for micro-resistor

A resistance test and tester technology, applied in the direction of measuring resistance/reactance/impedance, instruments, measuring devices, etc., can solve the problems of time-consuming, low test accuracy, etc., to improve measurement accuracy, increase heat dissipation, and reduce thermal electromotive force. Effect

Inactive Publication Date: 2018-05-08
HUBEI SANJIANG AEROSPACE WANFENG TECH DEV
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  • Abstract
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  • Application Information

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Problems solved by technology

[0003] Aiming at the above defects or improvement needs of the prior art, the present invention provides a precision tester for tiny resistors, which so

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  • Precise tester for micro-resistor
  • Precise tester for micro-resistor

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Embodiment Construction

[0031] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0032] figure 1 It is a structural block diagram of a precision tester for tiny resistance provided by the present invention, including a data processing module, an AC / DC power conversion module, a data acquisition module and a tiny resistance testing module; the tiny resistance testing module includes a constant current source circuit and signal amplifier circuit;

[0033] Among them, the con...

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Abstract

The invention discloses a precise tester for a micro-resistor. The precise tester comprises a data processing module, a data acquisition module and a micro-resistor test module. The micro-resistor test module comprises a constant current source circuit and a signal amplification circuit which are connected with the micro-resistor Rx to be tested. The constant current source circuit is used for applying constant current to the micro-resistor Rx to be tested. The data acquisition module acquires and processes the amplified voltage signal. The data processing module calculates the resistance value of the micro-resistor according to the constant current value and the acquired voltage value. The constant current source circuit comprises a constant current source Is and a clamp resistor Rc whichis connected in parallel with the micro-resistor Rx to be tested. The constant current source Is is used for applying constant current which is not greater than the current threshold to the micro-resistor Rx. The clamp resistor Rc clamps the voltage Ux of the micro-resistor Rx to be lower than the voltage threshold so that the measurement error caused by excessively high output voltage can be avoided. The precise tester for the micro-resistor has high test accuracy, multiple measurable channels, high degree of test automation and fast measurement speed so as to be particularly suitable for batch test of the micro-resistor.

Description

technical field [0001] The invention belongs to the technical field of resistance measurement, and more specifically relates to a precision tester for multi-channel micro-resistance combined with hardware and software. Background technique [0002] In military or civilian products, resistance measurement is often done by electronic workers, especially in military products, the test accuracy of resistance is high, especially for the measurement of tiny resistance. At present, the commonly used method for measuring small resistance is the constant current potentiometric method using the four-wire connection method. Although the four-wire connection method can overcome the resistance of the wires and reduce the requirements for the contact resistance of the connecting wires and terminals, it cannot overcome the resistance caused by the film resistance, Measurement errors caused by contact potentials and thermoelectric potentials. With the improvement of performance requirement...

Claims

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Application Information

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IPC IPC(8): G01R27/08
CPCG01R27/08
Inventor 汤恒曾文兵张锐仁钦喻伟雷小江周卫华
Owner HUBEI SANJIANG AEROSPACE WANFENG TECH DEV
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