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Fault testing method and system for electro-optic theodolite

A photoelectric theodolite and fault testing technology, which is applied in the direction of instruments, measuring devices, etc., can solve the problems of blank, fault extension maintenance and fault diagnosis, and failure to obtain fault information, etc., and achieve the effect of reducing difficulty

Active Publication Date: 2018-05-11
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] In the prior art, the fault testing technology of the photoelectric theodolite is basically blank. Only when the photoelectric theodolite automatically alarms the failure of each extension, the technician can learn which extension of the photoelectric theodolite breaks down, but because the photoelectric theodolite can only show which When an extension fails, more detailed fault information cannot be obtained, which makes it more difficult for technicians to repair and diagnose the faulty extension

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Embodiment Construction

[0034] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0035] The embodiment of the application provides a fault test method of the photoelectric theodolite, such as figure 1 As shown, based on the realization of the photoelectric theodolite fault test system, the photoelectric theodolite fault test system includes a test interface, a test adapter, and a test platform connected in sequence, and the test interface includes a resistance identification pin, a communication pin, an analog signal p...

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Abstract

The invention discloses a fault testing method and system for an electro-optic theodolite. The fault testing method for the electro-optic theodolite is implemented on the basis of the electro-optic theodolite fault testing system with a unified test interface. The method comprises the steps that firstly, a test signal set of to-be-tested extension sets composed of component testing signals of theto-be-tested extension sets is read through a test adapter, then, the component testing signals in the testing signal set are compared with component expected signals, abnormal components in the to-be-tested extension sets are determined, and therefore the purpose of fault diagnosis of the components of the to-be-tested extension sets of the electro-optic theodolite is achieved, the fault diagnosis granularity is lowered to form the components of the to-be-tested extension sets, a technicist can perform maintenance and specific fault diagnosis on the faulted components, and the maintenance andfault analysis difficulty of the electro-optic theodolite is lowered.

Description

Technical field [0001] This application relates to the technical field of photoelectric theodolites, and more specifically, to a fault testing method and system for photoelectric theodolites. Background technique [0002] The photoelectric theodolite is a large-scale optical measuring device used in a modern shooting range to test external ballistic data and flight status. [0003] The photoelectric theodolite is mainly composed of optical system (telescope), tracking servo system (tracking TV, tracking frame, servo controller and electronic control), angle measuring system (azimuth and pitch encoder), recording system, etc., among which, the components of these systems The equipment is also called the extension of the photoelectric theodolite. With the improvement of the performance and complexity of the photoelectric theodolite, it is more and more difficult to detect and diagnose the fault of the photoelectric theodolite, and it is urgent to develop a test design. [0004] In th...

Claims

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Application Information

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IPC IPC(8): G01C25/00
CPCG01C25/00
Inventor 王鹤淇彭树萍于洪君王伟国姜润强李博刘廷霞
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI