MEMS accelerometer

An accelerometer and area technology, applied in the direction of measuring acceleration, multi-dimensional acceleration measurement, velocity/acceleration/shock measurement, etc., can solve problems such as stress warping, MEMS structural plane and fixed electrode plane are not parallel, to reduce sensitivity, Effects of avoiding sensor damage and increasing torque

Pending Publication Date: 2018-05-11
SENODIA TECH (SHANGHAI) CO LTD
View PDF8 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of this, the present invention provides a MEMS three-axis accelerometer to solve the stress warpage caused by the manufacturing process or external environment temperature changes in the current accelerometer and the anchor point deflection caused by the manufacturing process, which leads to MEMS The problem of zero offset caused by the non-parallel plane of the structure and the plane of the fixed electrode

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • MEMS accelerometer
  • MEMS accelerometer
  • MEMS accelerometer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0031] The MEMS accelerometer of the present invention mainly improves the acceleration detection of Z-axis input. One is to divide the detection mass into the first mass block and the second mass block, and the Z-axis detection capacitor group composed of the two mass blocks and the fixed electrodes is in the plane of the MEMS structure layer relative to the anchor area in the X-axis or Y The distribution distance in one direction of the axis is equivalent, t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides an MEMS accelerometer. The MEMS accelerometer comprises a substrate, a movable part and a fixed electrode assembly, wherein an anchoring region is formed in the surface of the substrate; the movable part is connected with the anchoring region by virtue of a supporting beam and is suspended above the substrate, and the movable part comprises a first mass block and a second mass block; a first hollowed-out region is formed in the middle part of the first mass block and is I-shaped, and the second mass block is arranged in the first hollowed-out region; and the fixed electrode assembly comprises a first electrode assembly, the first electrode assembly is fixed on the surface of the substrate and is arranged between the substrate and the movable part, and the first electrode assembly forms a Z-axis detection capacitor bank with the first mass block and the second mass block, so that accelerated speed input along a Z axis is detected. The MEMS accelerometer provided by the invention has the advantages that the two mass blocks are arranged at an interval in a Y axis direction, so that the accelerometer not only can reduce substrate warping influence caused by stress but also can reduce zero offset caused by deflection of initial states of the mass blocks.

Description

technical field [0001] The invention relates to the field of microelectromechanical systems, and more specifically, relates to a MEMS accelerometer. Background technique [0002] Micro-Electro-Mechanical Systems (MEMS) are micro-structures, micro-sensors, control processing circuits, and even interfaces, communications, and power supplies that are fabricated on one or more chips by using integrated circuit manufacturing technology and micro-processing technology. integrated system. Due to its small size, low cost, good integration, excellent performance and many other advantages, MEMS has been used more and more in a wide range of fields such as industry, medical treatment, civilian use, and military affairs. Acceleration sensor, as the most typical device using micro-electromechanical technology, has almost become the standard configuration of various mobile terminals, cameras, game controllers, navigators and other products. MEMS accelerometers can be divided into capaci...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01P15/18
CPCG01P15/18G01P15/125G01P2015/0831
Inventor 邹波郑青龙
Owner SENODIA TECH (SHANGHAI) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products