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Accelerated aging test method for high-voltage parallel capacitors

A technology for accelerating aging and testing methods, which is applied to instruments, measuring electricity, and measuring electrical variables. It can solve the problems of high cost and accelerated test time, and achieve the effects of convenient operation, shortened test time, and small size.

Inactive Publication Date: 2018-05-18
CHINA XD ELECTRIC CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to the fixed stress of this durability evaluation method, the accelerated test time is longer and the cost is expensive.

Method used

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  • Accelerated aging test method for high-voltage parallel capacitors
  • Accelerated aging test method for high-voltage parallel capacitors
  • Accelerated aging test method for high-voltage parallel capacitors

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0038] A high-voltage shunt capacitor accelerated aging test method, comprising the steps of:

[0039] A. Select a component used to make a high-voltage shunt capacitor with a fixed product model as the test object, randomly select 60 components, measure and record their capacitance before the test.

[0040]B. Then place the components in the oil tank, which is filled with benzyl toluene insulating oil and then placed in an oven with adjustable temperature.

[0041] C. Set the temperature of the oven to 85°C, and apply 1.3U immediately after the temperature of the component is stable at 85°C NE The voltage lasts for 30.7h. After the end, measure and record its capacitance. If the capacitance decreases, it means that there is a component breakdown. Remove the component and record the number of removed components, and continue the test for the remaining components.

[0042] D. Adjust the oven temperature to 80°C, and apply 1.5U immediately after the component temperature stabil...

Embodiment 2

[0048] A high-voltage shunt capacitor accelerated aging test method, comprising the steps of:

[0049] A. Select a component used to make a high-voltage shunt capacitor with a fixed product model as the test object, randomly select 60 components, measure and record their capacitance before the test.

[0050] B. Then place the components in the oil tank, which is filled with benzyl toluene insulating oil and then placed in an oven with adjustable temperature.

[0051] C. Set the temperature of the oven to 84°C. After the temperature of the component is stable at 84°C, apply 1.26U immediately. NE The voltage lasts for 38.1 hours. After the end, measure and record its capacitance. If the capacitance decreases, it means that there is a component breakdown. Remove the component and record the number of removed components, and continue the test for the remaining components.

[0052] D. Adjust the oven temperature to 79°C, and apply 1.46U immediately after the component temperature ...

Embodiment 3

[0058] A high-voltage shunt capacitor accelerated aging test method, comprising the steps of:

[0059] A. Select a component used to make a high-voltage shunt capacitor with a fixed product model as the test object, randomly select 60 components, measure and record their capacitance before the test.

[0060] B. Then place the components in the oil tank, which is filled with benzyltoluene insulating oil and placed in an oven with adjustable temperature.

[0061] C. Set the temperature of the oven to 90°C, and apply 1.34U immediately after the temperature of the element stabilizes at 90°C NE The voltage lasts for 22.4 hours. After the end, measure and record its capacitance. If the capacitance decreases, it means that there is a component breakdown. Remove the component and record the number of removed components, and continue the test for the remaining components.

[0062] D. Adjust the temperature of the oven to 83°C, and then apply 1.54U after the temperature of the componen...

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Abstract

The invention discloses an accelerated aging test method for high-voltage parallel capacitors. The method comprises steps of: first, placing a plurality of capacitor components in a sealed oil tank, filling the oil tank with insulating oil, and then placing the oil tank in an oven with adjustable and controllable temperature; successively applying temperature and voltage to the capacitor components for a certain time, wherein the voltage gradually increases with the increase of time and the temperature gradually decreases with the increase of time; and finally, calculating the number of breakdown capacitor elements, and determining that an accelerated aging test succeeds if the number of the breakdown capacitor elements is less than one third of the sampled capacitor elements, or determining that the accelerated aging test fails if the number of the breakdown capacitor elements is greater than or equal to one third of the sampled capacitor elements. The accelerated aging test method can shorten the test time for evaluating the reliability of the high-voltage parallel capacitors and can reduce cost.

Description

technical field [0001] The invention relates to the field of reliability detection of power capacitors, in particular to an accelerated aging test method for high-voltage parallel capacitors. Background technique [0002] With the construction of more and more EHV and UHV DC transmission lines in my country, the reliability of power capacitors as reactive power compensation devices has attracted more and more attention. At present, the life test of current power capacitors is generally carried out in accordance with the national standard "Part 2 Durability Test of Parallel Capacitors Used in AC Power Systems with Nominal Voltage Above 1kV". The specific operation in the standard is to stabilize the temperature of the three power capacitors at 60°C and apply 1.40U N Continuously run for 1000h, or apply 1.25U N , running continuously for 3000h. The acceptance criterion is that no breakdown occurs during the two-unit test, and one unit breakdown is allowed during the three-u...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
Inventor 湛海涯信建伟
Owner CHINA XD ELECTRIC CO LTD