Measuring system and measuring method for time-resolved spectrum of single-particle excitation of scintillation crystal

Abstract

The invention belongs to the technical field of radiation detection, in particular to a measuring system and a measuring method for measuring the time-resolved spectrum of single-particle excitation of a scintillation crystal. The measuring system includes a camera obscura, a spectrometer, a first photomultiplier and a radiation source at the light inlet end of the spectrometer, and a second photomultiplier at the light outlet end of the spectrometer. The spectrometer, the first photomultiplier, the radiation source and the second photomultiplier are located in the camera obscura. The measuring system further includes a high-voltage power supply, a first preamplifier and constant-ratio timer, a second preamplifier and constant-ratio timer, a delayer, a time-to-amplitude converter, a multi-channel analyzer and a computer which are located outside the camera obscura. The problem that the time resolution of the time-resolved excitation spectrum obtained through an accelerator is limited by the pulse width of the accelerator and the change in scintillation performance of materials caused during test results in an accurate test result is solved.

Description

technical field [0001] The invention belongs to the technical field of radiation detection, and in particular relates to a measuring system and a measuring method for measuring the time-resolved spectrum excited by a scintillation crystal single particle. Background technique [0002] Spectroscopy is a branch of optics, which mainly studies the generation of spectra of various substances and their interaction with substances. Spectrum is the orderly arrangement of electromagnetic radiation according to the wavelength. According to different experimental conditions, each radiation wavelength has its own characteristic intensity. Through the study of spectroscopy, people can obtain the knowledge of the energy level structure of atoms and molecules, energy level lifetime, electronic configuration, molecular geometry, properties of chemical bonds, reaction kinetics and other aspects of material structure. Therefore, the spectral feature of a substance is a very important parame...

AI Technical Summary

Problems solved by technology

[0006] The technical problem solved by the present invention is to provide a measurement system for measuring the time-resolved excitation spectrum of scintillation crystal single particles, and at the same time provide a measurement method based on the system, which solves the problem of the time resolution of the time-resolved excitation spectrum obtained through an accelerator. Limited by the pulse width of the accelerator, and during the test, the change of the scintillation performance of the material causes the problem of inaccurate test results

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