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A Metering Information System Based on General System Framework

A technology of measurement information and framework, applied in the field of measurement information system, can solve the problems of inconsistent data interaction interface, non-standard construction method, low reusability rate, etc., and achieve the goal of improving software quality, realizing standardization, and reducing repetitive development Effect

Active Publication Date: 2021-05-18
BEIJING AEROSPACE INST FOR METROLOGY & MEASUREMENT TECH +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The current dedicated metering information system has exposed many problems, such as: the data interaction interface is not uniform, and there is no standardization; the reusability rate is low, the lack of later expansion and versatility; the certificate cannot be automatically generated, etc.
With the development of measurement and calibration business informatization, the reliance on the calibration system of the measurement information system is getting higher and higher, and the decentralized and non-standard construction method can no longer meet the measurement assurance needs of aerospace model development. One method is suitable for various types of equipment The dedicated metering information system to be developed

Method used

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  • A Metering Information System Based on General System Framework
  • A Metering Information System Based on General System Framework

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Embodiment Construction

[0015] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0016] The metrology information system is closely integrated with each calibration device, and is used to control each calibration instrument and equipment to realize the automatic / semi-automatic control of the calibration process. It provides operation prompts and instrument control functions for the entire metrology calibration process, and has the ability to exchange data with the metrology information system. Features. According to the difference of the equipment under test, the operator can respectively open the corresponding calibration function module to complete the equipment verification task.

[0017] Such as figure 1 , figure 2 As shown, the measurement information system based on the general framework of the present invention includes: a view business layer, a data layer, a functional interface layer and a driver layer. The s...

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Abstract

The invention belongs to the technical field of automatic measurement and calibration, and in particular relates to a measurement information system based on a general system framework. The view business layer includes functional self-inspection module, equipment verification module, data interaction module, data management module and system management module. During the verification process, the data used for human-computer interaction is displayed on the software interface, and each module is packaged into an independent Dynamic link library; the data layer covers the data information related to the measurement test, encapsulates the data calculation and result determination algorithm in the measurement verification process, and formulates the automatic test original record standard, the device communication protocol standard and the database data storage standard; function The interface layer is the encapsulation of functional interfaces for various devices; the driver layer is the encapsulation of all acquisition card drivers, data source drivers and hardware underlying drivers of standard instruments, which are connected with the measured object to complete the collection of data information. The invention can realize the standardization, networking and intelligence requirements of the metering system.

Description

technical field [0001] The invention belongs to the technical field of automatic measurement and calibration, and in particular relates to a measurement information system based on a general system framework. Background technique [0002] In recent years, my country's aerospace industry has achieved rapid development. Major national scientific and technological projects represented by manned spaceflight, lunar exploration projects, and high-tech projects have been implemented one after another. Measurement has played an important role in various links such as model development, launch, operation, return, and delivery. played an important role. The current dedicated metering information system has exposed many problems, such as: the data interaction interface is not uniform, and there is no standardization; the reusability rate is low, the lack of later expansion and versatility; the certificate cannot be automatically generated, etc. With the development of measurement and c...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F8/20
CPCG06F8/24
Inventor 张修建高翌春王兵刘晓旭张鹏程靳硕印朝辉张铁犁
Owner BEIJING AEROSPACE INST FOR METROLOGY & MEASUREMENT TECH
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