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Miniaturized total-reflection type femtosecond laser pulse shape measurement device

A femtosecond laser and pulse shape technology, applied in the direction of the instrument, can solve the problems affecting the measurement, stray light, and difficult adjustment of the optical path, and achieve the effects of scattering noise removal, accurate measurement, and reduction of dispersion effects

Active Publication Date: 2018-05-22
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

Spherical mirrors will introduce coma aberration during off-axis focusing, which will affect the measurement; compared with spherical mirrors, parabolic mirrors have better focusing characteristics, but the adjustment of the optical path is more difficult, and stray light is often brought about due to process reasons

Method used

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  • Miniaturized total-reflection type femtosecond laser pulse shape measurement device
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  • Miniaturized total-reflection type femtosecond laser pulse shape measurement device

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Embodiment Construction

[0022] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments, but the protection scope of the present invention should not be limited thereto.

[0023] Embodiment 1 measuring device of the present invention is as figure 1 As shown in (a), the whole device is placed on an optical flat plate of 250*150mm, and the devices used in the example device include: four small hole aperture plates 1 (each small hole diameter is 3mm, and the spacing is 4.24mm), The first plane reflector 2 (L-shaped reflector with silver-coated film), the second plane reflector 3 (uncoated apex angle is 5° wedge-shaped quartz glass sheet), the first spherical reflector 4 (silver-coated film, focal length 100mm), the first nonlinear medium 5 (0.5mm thick quartz glass sheet), the third plane mirror 6 (silver-coated film, about 3mm in diameter), the fourth plane mirror 7 (silver-coated film mirror) , lens 8 (quartz, focal length 100mm), fib...

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Abstract

The invention provides a miniaturized total-reflection type femtosecond laser pulse shape measurement device. A reflection type element is used before signal light is generated, so that measurement errors caused by the fact that a transmission type element introduces chromatic dispersion is avoided and the limitation of bandwidth is avoided; a light path structure of the device has a compact and stable structure, is small and firm and is easy to adjust. The principle of the measurement device adopts a self-reference spectral interference method; a transient-state grating signal is obtained byutilizing a three-order non-linear effect of materials including a glass thin sheet and the like and is used as self-reference light; the self-reference light and delayed light to be detected are subjected to spectral interference to obtain spectral interference stripes; spectrum and phase information of the light to be detected are reconstructed by carrying out analysis treatment on the interference stripes through methods including Fourier transform spectral interference and the like, so that a pulse shape to be detected and a phase are restored and measurement of femtosecond pulse shapes and widths is realized.

Description

technical field [0001] The invention relates to the shape and phase measurement of time-domain pulses of femtosecond laser pulses in the field of femtosecond laser technology research, in particular to a miniaturized total reflection femtosecond laser pulse shape measurement device. Background technique [0002] With the advent of ultrashort laser systems, femtosecond laser pulses have been widely used in many scientific research fields such as physics, materials science, chemistry, biology, and bioengineering. The time distribution and phase measurement of femtosecond laser pulses are directly related to the application of femtosecond laser pulses in these fields, and these parameters also provide important indicators for the detection of the operating status of the laser system. Over the past three decades, frequency-resolved optical switching (FROG), spectral phase coherent direct electric field reconstruction (SPIDER), spectral interferometry (SI), dispersive scanning (d...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00
CPCG01J11/00
Inventor 刘军朱晶鑫申雄司哲
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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