Electrostatic discharge protection device evaluation method, device and computer readable storage medium

Abstract

An embodiment of the invention provides an electrostatic discharge protection device evaluation method, an electrostatic discharge protection device evaluation device and a computer readable storage medium, which are applied to the technical field of electronics. The electrostatic discharge protection device evaluation method is applicable to an ESD protection device which is of a gate-grounded N-channel field effect transistor structure. The electrostatic discharge protection device evaluation method comprises the steps of: determining self-heating thermal resistance of the ESD protection device according to thermal conductivity, volume density, heat dissipation surface area and ambient temperature of the ESD protection device; and evaluating thermal stability of the ESD protection deviceaccording to the self-heating thermal resistance. The electrostatic discharge protection device evaluation method, the electrostatic discharge protection device evaluation device and the computer readable storage medium solve the problems that the electrothermal effect of the prior art has great influence on the ESD protection device and a protected core circuit and the normal operation of a chipis jeopardized.

Description

【Technical field】 [0001] The invention relates to the field of electronic technology, in particular to an evaluation method, device and computer-readable storage medium of an electrostatic discharge protection device. 【Background technique】 [0002] As electrostatic discharge (Electro Static Discharge, ESD) protection devices are widely used in various analog integrated circuits, radio frequency integrated circuits and mixed-signal integrated circuit chips, their own thermal stability becomes particularly critical. Although the ESD protection device has good electrical characteristics, when it relies on a single device or a combination of devices to discharge transient high-voltage and high-current electrostatic pulses, it will cause the crystal lattice temperature of the ESD protection device itself to rise sharply. The ESD protection device generates a certain amount of heat in a short time and in a limited space, which will cause the electrical parameters of the protected...

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Problems solved by technology

[0003] In view of this, an embodiment of the present invention provides an evaluation method, device and computer-readable storage medium for an electrostatic discharge protection device to solve the problem that the electrothermal effect in the prior art has a great influence on the ESD protection device and the protected core circuit, and endangers the chip. problem with normal work

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