This application provides an AI
device evaluation method, apparatus, device, and medium based on stepped pressure. The method includes: for each AI device to be evaluated, obtaining at least one type of test
load model based on AI device domain requirements and AI
device parameters; running the AI device to be evaluated in each test
load model; applying multiple levels of fixed stepped pressure to each test
load model; when the test load model is stable under each level of fixed stepped pressure; collecting multi-dimensional performance parameters of the AI device to be evaluated; determining cross-vendor multi-dimensional normalized reference values of the test load model based on historical standard parameters of the reference AI device; calculating a comprehensive
score for the AI device to be evaluated based on the multi-dimensional performance parameters of each test load model, AI device domain requirements, and cross-vendor multi-dimensional normalized reference values of each test load model; and evaluating the AI device with the highest comprehensive
score as the optimal device that meets the AI device domain requirements, thereby improving the accuracy of the evaluation results.