Large-aperture reflection optical system detection device and method

Abstract

The present invention relates to a large-aperture reflection optical system detection device and method. The system comprises a pyramid prism array and a point light source emission and receiving device. The pyramid prism array is installed in front of a large-aperture reflection optical system to be detected, and bottom surfaces of all the pyramid prisms in the pyramid prism array just face the large-aperture reflection optical system to be detected; the aperture of the pyramid prism array is larger than the aperture of the large-aperture reflection optical system to be detected; a light beamemitted by the point light source emission and receiving device is incident into the large-aperture reflection optical system to be detected, is changed to a parallel light beam after passing throughthe large-aperture reflection optical system to be detected, is incident into the a pyramid prism array, is changed to a plurality of small-aperture parallel light beams being parallel to the incident light beam after passing through the pyramid prism array, is incident to the large-aperture reflection optical system to be detected, is changed to a gathering light beam array after passing throughthe large-aperture reflection optical system to be detected, and enters the point light source emission and receiving device. The large-aperture reflection optical system detection device and methodare low in manufacturing cost, and high in test precision with no need for intervention of any extra test special-purpose tools.

Description

technical field [0001] The invention relates to the field of optical system detection, in particular to a large-aperture reflective optical system detection device and method. Background technique [0002] In the design, manufacture and use of large-aperture reflective optical systems, great attention is paid to the imaging performance of the system, that is, the imaging quality. Currently, the commonly used image quality detection methods include star point method and optical interference self-collimation detection method. When using the star point method to test, a set of collimator with an aperture larger than the reflective system under test and a focal length more than 2.5 times that of the system under test is required. However, the image quality of the optical interference self-collimation detection system requires a high-precision flat mirror with an aperture larger than the aperture of the optical system to be tested. [0003] But there is following deficiency in a...

AI Technical Summary

Problems solved by technology

[0004] 1. Large diameter, long focal length collimator and large diameter plane mirror are very expensive to manufacture, and the economic cost of system testing is relatively high;

[0005] 2. The reflective optical system needs to detect the imaging quality of different fields of view during detection. The star point method needs to design a special fixture to adjust the angular position relationship between the system to be tested and the collimator, which introduces additional test costs and takes too long

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