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Dark channel-based scanning electron microscope image definition no-reference evaluation method

A technology of image clarity and scanning electron microscope, applied in image enhancement, image analysis, image data processing and other directions, can solve the problems of unsatisfactory image quality performance of scanning electron microscope, no image design of scanning electron microscope, etc., to achieve the effect of performance improvement

Active Publication Date: 2018-07-17
CHINA UNIV OF MINING & TECH
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Problems solved by technology

[0005] None of the above methods are designed for scanning electron microscope images, and it is found through experiments that these methods are not ideal in evaluating the quality of scanning electron microscope images, so there is an urgent need for a special method for evaluating the clarity of scanning electron microscope images

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  • Dark channel-based scanning electron microscope image definition no-reference evaluation method
  • Dark channel-based scanning electron microscope image definition no-reference evaluation method
  • Dark channel-based scanning electron microscope image definition no-reference evaluation method

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Embodiment Construction

[0046] The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0047]The invention relates to a dark channel-based scanning electron microscope image clarity evaluation method without reference. Since there is no scanning electron microscope image database, this embodiment first constructs a database of 650 scanning electron microscope images, and obtains the subjective quality scores of the images through subjective experiments, and extracts 150 fuzzy and distorted images from the 650 scanning electron microscope images and It corresponds to the subjective quality score. Secondly, the dark channel preprocessing is performed on the original SEM blurred image, and the edge of the preprocessed image is calculated again. After the edge is obtained, it is enhanced with an edge-preserving filter based on the weighted square Noise, and finally according to the visual characteristics of human be...

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Abstract

The invention provides a dark channel-based scanning electron microscope image definition no-reference evaluation method. The method comprises the steps of performing dark channel preprocessing on anoriginal scanning electron microscope blurred image; calculating the edge of the preprocessed image; after the edge is obtained, performing enhanced denoising on the edge by using a weighted least square method-based edge-preserving filter; and finally according to visual features of human being, taking a weight of a maximum gradient and an average gradient as a quality score of the image. A darkchannel is applied to the scanning electron microscope image quality evaluation for the first time; and the performance of the proposed method is superior to that of a typical blurred image quality evaluation method at present.

Description

technical field [0001] The invention relates to the field of image quality evaluation, in particular to a dark channel-based scanning electron microscope image clarity evaluation method without reference. Background technique [0002] Scanning electron microscope images broaden human vision and provide a way to obtain fine structure information. In the process of obtaining SEM images, various types of distortions will be caused, and these distortions directly affect the judgment of human beings on research objects, so the quality evaluation of SEM images is of great significance, but the current quality evaluation of SEM images is not Not getting attention. The image clarity of scanning electron microscope images is the most important technical index in the imaging process. Usually, it is necessary to repeatedly adjust the imaging parameters and settings to obtain clear images, which is time-consuming and laborious. Therefore, a method for evaluating the clarity of scanning...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/13
CPCG06T7/0002G06T7/13G06T2207/30168G06T2207/10061
Inventor 李雷达李巧月卢兆林周玉胡波祝汉城
Owner CHINA UNIV OF MINING & TECH
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