Evaluation Method of Lifetime Characteristics of Wafer-Level Non-Volatile Memory
A non-volatile, memory technology, used in instruments, special data processing applications, design optimization/simulation, etc., can solve the problems of inconvenient data collection and statistical analysis, long test time, and inability to achieve a large number of simultaneous tests. The effect of data collection and statistical analysis
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[0020] The specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, but it should be understood that the protection scope of the present invention is not limited by the specific embodiments.
[0021] Unless expressly stated otherwise, throughout the specification and claims, the term "comprise" or variations thereof such as "includes" or "includes" and the like will be understood to include the stated elements or constituents, and not Other elements or other components are not excluded.
[0022] The life characteristic evaluation method of the wafer-level non-volatile memory provided by the present invention is to select one or more test units on the wafer to be tested, and connect the probe card of the test machine to the test unit to realize non-volatile memory. Batch parallel test of the erasing and writing life of volatile memory, and record the test information in detail in the test result. After the t...
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