Evaluation Method of Lifetime Characteristics of Wafer-Level Non-Volatile Memory

A non-volatile, memory technology, used in instruments, special data processing applications, design optimization/simulation, etc., can solve the problems of inconvenient data collection and statistical analysis, long test time, and inability to achieve a large number of simultaneous tests. The effect of data collection and statistical analysis

Active Publication Date: 2022-02-11
BEIJING CHIP IDENTIFICATION TECH CO LTD +2
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] 1. Affected by the packaging form and test resources, this method takes a long time to test and has low efficiency
[0005] 2. It is impossible to realize a large number of simultaneous measurements, and it is not convenient for data collection and statistical analysis

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  • Evaluation Method of Lifetime Characteristics of Wafer-Level Non-Volatile Memory
  • Evaluation Method of Lifetime Characteristics of Wafer-Level Non-Volatile Memory
  • Evaluation Method of Lifetime Characteristics of Wafer-Level Non-Volatile Memory

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Embodiment Construction

[0020] The specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, but it should be understood that the protection scope of the present invention is not limited by the specific embodiments.

[0021] Unless expressly stated otherwise, throughout the specification and claims, the term "comprise" or variations thereof such as "includes" or "includes" and the like will be understood to include the stated elements or constituents, and not Other elements or other components are not excluded.

[0022] The life characteristic evaluation method of the wafer-level non-volatile memory provided by the present invention is to select one or more test units on the wafer to be tested, and connect the probe card of the test machine to the test unit to realize non-volatile memory. Batch parallel test of the erasing and writing life of volatile memory, and record the test information in detail in the test result. After the t...

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Abstract

The invention discloses a method for evaluating the lifetime characteristics of a wafer-level non-volatile memory. The method is to select one or more test units on the wafer to be tested, the test unit includes a plurality of non-volatile memories, and the probe card of the test machine is connected to the test unit to perform non-volatile memories. Evaluation of life characteristics. The lifetime characteristic evaluation includes data retention ability evaluation and rewritable ability evaluation. The method for evaluating the life characteristics of the wafer-level nonvolatile memory has short test time and high efficiency, and can realize a large number of simultaneous tests, which is convenient for data collection and statistical analysis.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a method for evaluating life characteristics of a wafer-level nonvolatile memory. Background technique [0002] Since the advent of the first generation of non-volatile memory (NVM) in the 1980s, non-volatile memory has been widely used due to its high density, low cost, and high reliability. With the rapid development of electronic information technology and its application in the fields of industrial products and automotive electronics, people's requirements for the erasing speed, capacity and reliability of non-volatile memory are increasing day by day. The level is continuously upgraded to the nanometer level, which brings higher density, higher storage capacity, and faster speed. With the passage of memory usage time, the number of erasing and writing increases, which will reduce the storage efficiency and data retention of the memory. phenomenon, resulting in functional failure...

Claims

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Application Information

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IPC IPC(8): G06F30/20G06F119/14
CPCG06F2119/04G06F30/20
Inventor 李大猛马强赵东艳张海峰唐晓柯陈燕宁袁远东关媛
Owner BEIJING CHIP IDENTIFICATION TECH CO LTD
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