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A method and device for testing the threshold of two-photon materials

A two-photon, threshold technology, applied in instruments and other directions, can solve problems such as loss of output power and inaccuracy, and achieve the effect of a wide range of tests

Inactive Publication Date: 2019-07-23
JIANGNAN UNIV +1
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  • Abstract
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Problems solved by technology

However, under different wavelengths, the polymerization threshold and ablation threshold of the material will change, and the laser will pass through multiple optical lenses from the time it is emitted until it reaches the micro-processing platform. At this time, the output power will be lost, so the output power value of the laser is used as the polymerization threshold. or the ablation threshold is inaccurate

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  • A method and device for testing the threshold of two-photon materials
  • A method and device for testing the threshold of two-photon materials
  • A method and device for testing the threshold of two-photon materials

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Embodiment Construction

[0034] Embodiments of the present invention will be described in detail below in conjunction with examples, but those skilled in the art will understand that the following examples are only used to illustrate the present invention, and should not be considered as limiting the scope of the present invention. Those who do not indicate the specific conditions in the examples are carried out according to the conventional conditions or the conditions suggested by the manufacturer. The reagents or instruments used were not indicated by the manufacturer, and they were all commercially available conventional products.

[0035] attached figure 1 In, label description (from left to right): 3: computer, 11: semiconductor pumped solid-state laser, 12: titanium sapphire laser, 23: second dichroic mirror, 24: first dichroic mirror, 21: optical fiber, 22 : fiber optic spectrometer, 251: beam splitting power detector, 252: controller, 27: CCD camera, 28: second focusing lens, 26: third dichr...

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Abstract

The invention relates to a two-photon material threshold testing method and device. The method comprises the steps that 1 focusing is carried out; 2 the minimum threshold m and the highest threshold qof a sample and a two-photon processing window are determined, wherein the minimum threshold m and the highest threshold q are the splitting power values of a femtosecond laser; and 3 the real powerWr of the surface of the sample and the splitting power Wp of the femtosecond laser are measured; the relationship between the real power Wr and the splitting power Wp is linearly fit into a power calibration equation v; according to the minimum threshold m, the highest threshold q and the two-photon processing window in the step 2, the power calibration equation v is used to calculate the accurate highest threshold w, the accurate minimum threshold x and the accurate two-photon processing window. The method is capable of accurately measuring the power value of the laser irradiated onto the surface of the sample to acquire the threshold of the sample.

Description

technical field [0001] The invention relates to a method and device for testing the threshold value of a two-photon material. Background technique [0002] Single-photon absorption refers to the transition of electrons from the ground state to the excited state after the molecule absorbs a photon with energy W. Two-photon absorption requires molecules to absorb two photons with energy W / 2 at the same time, in order to realize the transition of electrons from the ground state to the excited state. Just because the energy required for two-photon induction is only half of the energy required for single-photon induction, two-photon technology can use infrared light with strong penetrating ability instead of ultraviolet light to achieve the purpose of processing. Because femtosecond laser two-photon micromachining technology has the advantages of high processing precision, small thermal effect, no mask, high flexibility, and can truly realize 3D micromachining, it has become a r...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J11/00
CPCG01J11/00
Inventor 李治全陶卫东朱俊哲夏锦涛
Owner JIANGNAN UNIV
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