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Method for optimizing ship system testability index

A technology for system testing and index optimization, applied in design optimization/simulation, special data processing applications, instruments, etc., can solve the problems of relying on historical information, high requirements for expert systems, and high accuracy of neural network algorithms, achieving mature technology and easy promotion , Improve the effect of fault detection rate

Pending Publication Date: 2018-08-28
CHINA SHIP DEV & DESIGN CENT
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  • Abstract
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  • Claims
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AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a testability index optimization method for ship systems to solve the problems of the prior art that rely too much on historical information, have high requirements for expert systems, and have high precision for neural network algorithms.

Method used

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  • Method for optimizing ship system testability index
  • Method for optimizing ship system testability index
  • Method for optimizing ship system testability index

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specific Embodiment approach

[0075] The specific implementation of the present invention is described below by taking the power system as an example, including the following steps:

[0076] 1) Establish a typical task model of the system

[0077] As an important first-level system on board, the power system generally includes diesel generator sets (diesel engines, generators), switchboards, power distribution monitoring, distribution boxes, batteries, charging and discharging boards, shore power equipment, etc., according to its system composition and The functional relationship can establish a typical task model of the system, such as figure 1 .

[0078] 2) System FMECA

[0079] According to the task characteristics of the power system, FMECA is carried out on it, and all failure modes and hazard indexes of each component equipment are obtained as shown in Table 1.

[0080] Table 1 The failure mode and hazard index of each equipment in the power system

[0081]

[0082]

[0083] 3) Simplified s...

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Abstract

The invention provides a method for optimizing a ship system testability index. The method comprises the following steps that: S1: establishing a complex system typical task model; S2: carrying out system FMECA (Failure Mode Effects and Criticality Analysis); S3: simplifying a system task model; S4: establishing a testability model; S5: selecting a test point, and establishing a system diagnosis tree; S6: estimating the testability; and S7: optimizing the testability index. By use of the method for optimizing the ship system testability index, the FMECA and diagnosis tree logic analysis are carried out to do the testability design optimization work for the ship complex system to improve testability indexes including a fault detection rate, a fault isolation rate and the like to enable theship complex system to meet the development requirements of a ship product, and therefore, the method is the method for optimizing the ship complex system testability index, is mature in technology, simple, easy in implementation and convenient in popularization and is suitable for engineering application.

Description

technical field [0001] The invention relates to the field of ship product testing, in particular to a method for optimizing testability indexes of a ship system. Background technique [0002] Testability refers to a design characteristic of a product that can promptly and accurately determine its status (workable, non-workable, or degraded) and isolate its internal faults. In the 21st century, with the increasing complexity of ship products, the requirements for testable indicators closely related to testing and diagnostic capabilities are also increasing. However, at present, the testing indicators such as fault detection rate and fault isolation rate of marine products are relatively low, especially for complex systems such as propulsion system and power system due to their complex structure and complicated failure modes, the technology of optimizing testable indicators The difficulty is high and the workload is heavy. At present, there is no mature and effective testabil...

Claims

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F30/15G06F30/333G06F30/20
Inventor 刘晓白梁鸿马莹王丹吕俊杰
Owner CHINA SHIP DEV & DESIGN CENT
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