Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Tray for patterning of sapphire substrate in dry etching

A patterned sapphire, dry etching technology, applied in the direction of electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve the problems that affect the uniformity of sapphire substrate patterning, corrosion trays, etc., to increase the sealing, Improve temperature uniformity and facilitate circulation

Inactive Publication Date: 2018-09-14
XUZHOU GAPSS OE TECH
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The dry etching process generally uses a special tray to carry the sapphire wafer. During the etching process, the plasma bombards the sapphire wafer and reacts with the surface of the tray to corrode the tray. At the same time, the design of the tray will greatly affect the patterning of the sapphire substrate. Uniformity of

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Tray for patterning of sapphire substrate in dry etching
  • Tray for patterning of sapphire substrate in dry etching
  • Tray for patterning of sapphire substrate in dry etching

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. However, it should be understood that the specific embodiments described here are only used to explain the present invention, and are not intended to limit the scope of the present invention.

[0026] Unless otherwise defined, all technical terms and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field of the present invention, and the terms used in the description of the present invention herein are only to describe specific implementations The purpose of the example is not intended to limit the present invention.

[0027] like figure 1 , figure 2 , image 3 and Figure 4 As shown, a tray for patterning sapphire substrates in dry etching includes an upper tray 8 and a lower tray 1 coope...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Widthaaaaaaaaaa
Heightaaaaaaaaaa
Login to View More

Abstract

The invention discloses a tray for patterning of a sapphire substrate in dry etching, and belongs to the field of manufacture of semiconductor LED substrates. The tray comprises an upper tray and a lower tray matched with the upper tray, wherein a plurality of substrate supporting units are arranged in the lower tray; each supporting unit bulges out of the surface of the lower tray, a supporting unit groove structure is arranged on the surface of the supporting unit, a plurality of cooing air holes are formed in the supporting unit, and the supporting unit comprises an arc part and a flat edgepart and is defined by the arc part and the flat edge part by cooperating; hollowed-out parts matched with the supporting units in shape are formed in the upper tray, and a plurality of press feet are arranged on the outer edges of the circumferences of the hollowed-out parts; the upper tray and the lower tray are in coupling connection through nuts and cooperate to fix a sapphire wafer between the supporting units of the lower tray and the press feet of the upper tray. The service life of the tray is prolonged effectively, and patterning uniformity of the sapphire substrate is improved.

Description

technical field [0001] The invention relates to a tray for a patterned sapphire substrate in dry etching, belonging to the field of semiconductor LED substrate production. Background technique [0002] The manufacturing methods of PSS are mainly divided into dry etching and wet etching. Among them, dry etching has the advantages of good anisotropy, high etching selectivity, fast etching rate, and easy control. Widely used by manufacturing companies, it mainly consists of main process steps such as wafer cleaning, coating, exposure, development, and dry etching. At present, most enterprises use ICP (inductively coupled plasma) etching machine, which has the characteristics of high anisotropy, fast etching rate, good uniformity and high process stability. [0003] The dry etching process generally uses a special tray to carry the sapphire wafer. During the etching process, the plasma bombards the sapphire wafer and reacts with the surface of the tray to corrode the tray. At t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L21/673H01L21/67
CPCH01L21/67109H01L21/67333
Inventor 吕承鹏于玉斋张洋洋王明明吕飞郑锦涛
Owner XUZHOU GAPSS OE TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products