Sample in low-frequency measurement system, and preparation method and using method thereof
A measurement system and sample preparation technology, applied in the field of rock measurement, to achieve the effects of reducing unevenness, easy operation, and not easy to damage
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[0041] The present invention will be described in detail below in conjunction with the accompanying drawings.
[0042] The sample preparation method in the low-frequency measurement system provided by the invention comprises the following steps:
[0043] Standard parts will be made first, see image 3 , the standard part 2 includes a lower end body 3-1, a middle cylindrical body 3-2 and an upper end body 3-3 arranged sequentially from bottom to top. Wherein, the middle cylinder 3-2 is a hollow structure, and four second vertical strain gauges 3-6 are evenly pasted on the surface of the middle cylinder 3-2 to achieve the required strain for measuring the sample (average) Young's modulus. . The upper body 3-3 is embedded with a first ultrasonic longitudinal wave probe 3-4 (P wave) and a first ultrasonic transverse wave probe 3-5 (S wave), and the first ultrasonic longitudinal wave probe 3-4 is located on the first ultrasonic transverse wave probe 3-5 above.
[0044] Then mak...
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