X-ray coherent measuring device and measuring method

Abstract

The invention provides an X-ray coherent measuring device which comprises an x-ray beam splitting unit; an x-ray beam combining unit and an x-ray time-delay scanning unit which is arranged between thex-ray beam splitting unit and the x-ray beam combining unit and comprises a first pair of transmission reflecting mirrors and a second pair of transmission reflecting mirrors, wherein the first pairof transmission reflecting mirrors are symmetrically arranged relative to the central axis, the second pair of transmission reflecting mirrors are symmetrically arranged relative to the central axis;and the first pair of transmission reflecting mirrors are respectively fixed on the two sliding rails. The sliding rail directions of the two sliding rails are approximately perpendicular to the central axis. The second pair of transmission reflecting reflectors are fixed on a one-dimensional translation table together; and the translation direction of the one-dimensional translation table is parallel to the central axis. The invention further provides two measuring methods of the X-ray coherent measuring device. The X-ray coherent measuring device is applicable to an extreme ultraviolet XUV,a soft X-ray and a hard X-ray, and the time coherence length of attosecond pulses induced by soft X-ray free electron laser hard X-ray free electron laser and high-field laser can be directly measuredin a time domain.

Description

technical field [0001] The invention relates to the fields of X-ray optics, coherent optics, ultrafast optics and the like, in particular to a device and method for measuring time coherence and coherence of X-ray pulses. Background technique [0002] Since X-rays were discovered by German scientist Roentgen at the end of the 19th century, they have been widely used in scientific research and various general technical fields of society, playing an extremely important role. X-ray is a short-wavelength invisible light source. From the perspective of classical physics, its wavelength (<<10nm) is much smaller than the wavelength of visible light (400-700nm). From the beginning of the birth of X-ray, X-ray light source technology has made rapid development, its radiation wavelength is getting shorter and shorter, and the brightness of the light source is getting higher and higher. In particular, the increasingly mature synchrotron radiation source and undulator technology h...

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Problems solved by technology

[0006] With the development of X-ray free-electron laser technology and the light emission of hard X-ray free-electron laser (FEL), the measurement and research of hard X-ray time coherence has become more and more important and urgent, but there is no mature and reliable optical method at present. It is possible to directly measure the time coherence of X-rays, especially in the time domain, it is basically impossible to directly measure the time length and phase information of ultrashort X-ray radiation pulses of femtosecond and attosecond level

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