Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Detection method of voltage flicker parameters based on symmetrical mode decomposition of extreme points

A mode decomposition and voltage flicker technology, applied in the field of detection, can solve the problem of low accuracy of the fluctuation signal detection method, and achieve the advantages of over-fitting and under-fitting of the envelope, good real-time performance, and small end distortion Effect

Active Publication Date: 2020-10-09
SHANGHAI UNIVERSITY OF ELECTRIC POWER
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention aims at the problem of low accuracy of the existing power system fluctuation signal detection method, and proposes a voltage flicker parameter detection method based on extreme point symmetric mode decomposition. Firstly, the pole symmetric mode decomposition is performed on the signal to obtain a A series of intrinsic mode functions IMF with different characteristic scales, and then directly interpolate the IMF components to obtain the instantaneous amplitude and instantaneous frequency information of each harmonic

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Detection method of voltage flicker parameters based on symmetrical mode decomposition of extreme points
  • Detection method of voltage flicker parameters based on symmetrical mode decomposition of extreme points
  • Detection method of voltage flicker parameters based on symmetrical mode decomposition of extreme points

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] like figure 1 The flow chart of the voltage flicker parameter detection method based on the extreme point symmetrical mode decomposition shown in the figure includes the following steps:

[0037] 1. Perform denoising and discretization processing on the obtained voltage signal, remove the high frequency noise of the signal, and obtain the preprocessed signal.

[0038] 2. Use the pole-symmetrical mode decomposition ESMD method to decompose the obtained signal to obtain the IMF components of each natural mode.

[0039] like figure 2 Specifically, the following sub-steps are shown:

[0040] 2.1. Define the preprocessed voltage signal as Where N is a positive integer. Find all local extreme points E in X i (i=1, 2,..., n), n is the number of local extremum points.

[0041] 2.2. Connect the adjacent extreme points with line segments in order to find the midpoint F of the line segment i (i=1, 2, ..., n-1), and the two outermost midpoints F 1 , F n-1 Supplementary t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a voltage flicker parameter detection method based on extreme point symmetry mode decomposition. Based on the extreme symmetry mode decomposition theory and algorithm, a voltage flicker parameter detection step based on ESMD extreme point symmetry mode decomposition is given. Firstly, a voltage flicker signal is decomposed into single-frequency amplitude-modulated waves bythe ESMD method, and then the instantaneous amplitude and instantaneous frequency information of each single-frequency amplitude-modulated wave is obtained by the direct interpolation DI method. Theover-fitting and under-fitting of an envelope of the EMD method is overcome, and the modal aliasing phenomenon of the EMD method can be effectively avoided in the detection without adding noise; the defect that the detection result of the EEMD method strongly depends on the selected noise is overcome. The voltage flicker parameter detection method has strong self-decomposing ability in the detection of voltage flicker parameters, high detection precision, good real-time performance, less false mode, small end-end distortion of an amplitude-frequency curve, and small fluctuation.

Description

technical field [0001] The invention relates to a detection technology, in particular to a voltage flicker parameter detection method based on extreme point symmetric mode decomposition. Background technique [0002] In the context of the Energy Internet, the energy input forms of the power grid are diversified, and the disturbance problems faced by the power quality of the power grid are more complicated; among them, various high-power, impact, and nonlinear loads become the main sources that affect power quality; and based on micro-processing The precision electronic device of the device has higher and higher requirements for power quality; therefore, the society has higher and higher requirements for power quality, and the importance of power quality monitoring and management has become increasingly prominent. Accurate and timely detection of power quality is the premise of its governance. Among them, flicker is one of the most important forms of power quality disturbanc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R19/165
CPCG01R19/165
Inventor 张宇华赵晓柯王育飞薛花
Owner SHANGHAI UNIVERSITY OF ELECTRIC POWER
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products