Implementing method for precision measurement of high-precision spacecraft
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- SHANGHAI SATELLITE ENG INST
- Publication Date
- 2018-11-06
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Abstract
Description
technical field
[0001] The invention relates to the angular-second-level precision measurement of payloads in the process of spacecraft assembly and testing, and in particular to a high-precision spacecraft precision measurement method. Background technique
[0002] In order to ensure the normal operation of the payload and the realization of satellite performance indicators, it is necessary to measure, adjust and control the accuracy of the payload, the measurement execution components of the attitude control system, and other system-related stand-alone machines during ground assembly and testing. Generally, regular hexahedral prisms or polyhedral prisms are set up on the structure, and the optical axis of the prisms is used to characterize the physical characteristics of the load under test or a stand-alone machine. The measurement of installation and assembly accuracy is mainly carried out by establishing a station with electronic theodolites, which requires two or more th...