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A method for generating and testing secondary radar signals

A secondary radar and testing method technology, applied in radio wave measurement systems, instruments, etc., can solve the problems of high price, single function, poor adaptability, etc., achieve fast processing speed, eliminate frequency components, and meet the requirements of the effect

Active Publication Date: 2022-03-25
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, there are two main sources of signal generation and test devices commonly used in the industry. The first source is the signal generation and test devices developed by secondary radar equipment manufacturers. This type of equipment and devices has a single function and poor adaptability. ; The second source is the special testing equipment developed and produced by foreign third-party manufacturers. This type of equipment has powerful functions and good adaptability, but there are risks of high price and embargo

Method used

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  • A method for generating and testing secondary radar signals
  • A method for generating and testing secondary radar signals
  • A method for generating and testing secondary radar signals

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Embodiment

[0034] figure 1 It is a schematic diagram of a method for generating and testing a secondary radar signal of the present invention.

[0035] In this embodiment, as figure 2 As shown, a method for generating and testing a secondary radar signal of the present invention includes the following steps:

[0036] S1. Generate a baseband interrogation signal

[0037] S1.1. When starting to generate and test the secondary radar signal, first use the host computer software to set the signal generation parameters. The host computer software is the man-machine interface for signal generation and testing. The host computer software sets parameters such as the mode, type, frequency and side lobe suppression of the signal to be generated. The mode of the query signal that needs to be set includes A mode query, C mode query or S mode. There are three types of mode interrogation, among which, for the mode S interrogation signal, there are two types of all-call and roll-call. According to ...

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Abstract

The invention discloses a method for generating and testing secondary radar signals. Based on the generation of baseband interrogation signals, digital intermediate frequency signal processing, mixer up-conversion, frequency divider down-conversion, comparator waveform conversion, and time-domain over-conversion are sequentially performed. Sampling demodulation and decoding, test result processing and other steps, use programmable device FPGA as processing and control chip, realize the simulation of various types of secondary radar signals, and meet the test of airborne secondary radar equipment functions and indicators.

Description

technical field [0001] The invention belongs to the technical field of secondary radar signal generation and processing, and more particularly, relates to a method for generating and testing secondary radar signals. Background technique [0002] Secondary radar is an airborne avionics equipment that must be installed on various types of rotary-wing aircraft and fixed-wing aircraft. Broadly speaking, secondary radar is a communication system that employs On-Off Keying (OOK), Pulse Position Modulation (PPM), and Differential Phase Shift Keying (DPSK). The airborne secondary radar equipment receives the interrogation signal sent by the ground tower, and sends a reply signal containing information such as the height, identification code (Identity) of the aircraft; or the aircraft sends the interrogation signal, and then receives other aircraft The response signal is used to obtain information such as altitude, relative distance, relative bearing and identification code. Second...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S7/40
CPCG01S7/4052
Inventor 张朋李力黄建国
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA