Test Circuit and Method for Electric Readout Uncooled Infrared Detector

Abstract

The invention discloses a test circuit and method for an electrical readout uncooled infrared detector. The test circuit comprises a sample to be tested, fixed resistors, a variable resistor, a voltage source, a voltage amplification module, a voltmeter and a voltage oscilloscope; the sample to be tested is used as a measuring arm, the two fixed resistors are used as proportional arms, and the variable resistor is used as a comparison arm, and therefore, a Wheatstone bridge can be formed; the bridge is powered by the voltage source; the voltmeter is connected in parallel with the proportionalarms which are connected in series with the measuring arm; and the output end voltage of the bridge is amplified by the voltage amplification module, and the amplified voltage is displayed by the voltage oscilloscope. With the test circuit and method of the invention adopted, the response time, thermal conductivity and heat capacity of the electric readout uncooled infrared detector can be obtained through measurement. The test circuit and method have the advantages of simplicity, simple and convenient operation, various functions and high measurement precision.

Description

technical field The invention relates to the technical field of uncooled infrared detectors, in particular to a test circuit and method for electrically reading uncooled infrared detectors. Background technique Uncooled infrared detectors have been widely used in military, electric power, fire protection, medical and other fields. At present, uncooled infrared detectors can be divided into two types according to the imaging mechanism: electrical readout and optical readout. Among them, the electrical readout uses the thermal effect of the sensitive element in the structure to convert the thermal energy generated by infrared radiation into an electrical signal and then read out the image. Accurately measuring the performance parameters of the uncooled infrared detector at the pixel level is of great significance for the comprehensive evaluation of the performance of the electrical readout uncooled infrared detector, especially the thermal conductivity, heat capacity and resp...

AI Technical Summary

Problems solved by technology

Due to the mechanical delay in the chopping process of the mechanical chopper, it will cause great interference to the measurement of thermal response time; at the same time, the amount of radiation radiated from the black body to the pixel of the device also changes greatly after being modulated by the chopper, making The thermal response time measured by the mechanical chopper method has accuracy problems, and the measurement of the millisecond-level response time is greatly disturbed

However, the test equipment required by the pulsed infrared laser method is not easy to obtain, and the high-precision pulsed infrared laser source equipment is very expensive, and it is difficult for ordinary research institutes and companies to afford it.

In addition, when the mechanical chopper method and the pulsed laser method are used to measure the thermal response time, the self-heating effect of the device under the operating current will interfere with the measurement of the thermal response time.

Images