Feature Selection Method Based on L21 Normal Form Distance Metric
A feature selection method and distance measurement technology, applied in character and pattern recognition, instruments, computing, etc., can solve the problem of algorithm loss of feature selection, and achieve the effect of improving robustness and sparsity
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[0011] The present invention will be described in detail below in conjunction with the accompanying drawings.
[0012] This embodiment provides a feature selection method based on the L21 paradigm distance measure, including the following steps:
[0013] Step 1: Input the original data matrix and parameters;
[0014] The above original data matrix contains i categories, the first The data of the class is represented as ,in, is the row number of the original data matrix, is the i-th row of the original data matrix, each row of data has features;
[0015] Step 2: Perform SVD decomposition on the original data matrix to obtain a column-orthogonal matrix ;
[0016] Step 3: Pass the original data matrix and column-orthogonal matrix Compute the between-class scatter matrix in projected space and the intraclass scatter matrix ;
[0017] Step 4: Calculate the defined diagonal matrix D;
[0018] Each element in the above-mentioned diagonal matrix D is the reciproca...
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