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Confocal and annular total internal reflection dual-mode microscope system based on scanning galvanometer

A technology of confocal microscope and microscope system, which is applied in the direction of measuring devices, instruments, fluorescence/phosphorescence, etc., can solve the problems of uneven illumination and speckle, and achieve the effect of simple device, simplified microscope structure and cost saving

Pending Publication Date: 2018-12-07
ZHEJIANG UNIV
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Problems solved by technology

The traditional total internal reflection microscope with a single azimuthal angle of incidence introduces some speckles (interference fringes, etc.) due to uneven illumination

Method used

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  • Confocal and annular total internal reflection dual-mode microscope system based on scanning galvanometer
  • Confocal and annular total internal reflection dual-mode microscope system based on scanning galvanometer
  • Confocal and annular total internal reflection dual-mode microscope system based on scanning galvanometer

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Embodiment Construction

[0045] The present invention will be described in detail below in conjunction with the embodiments and accompanying drawings, but the present invention is not limited thereto.

[0046] Such as figure 1 As shown, the confocal and ring-shaped total internal reflection fluorescence microscopy based on the scanning galvanometer system. The microscope system consists of two parts.

[0047] The first part includes a collimating lens 3 that collimates and expands the excitation light emitted by the fiber, a dichroic mirror 4 that transmits the excitation light and reflects fluorescence, filters 5 that filter out stray light, and couples fluorescence to the fiber The focus lens 6 in the middle, the two-dimensional scanning system 8 that scans the sample, eliminates the distortion formed by the two-dimensional scanning system 8 and the fθ lens 9 that focuses the excitation light at the focal point, is used to form the field lenses 14 and 16 of the 4f system, and is used for Scene 11 o...

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Abstract

The invention discloses a confocal and annular total internal reflection dual-mode microscope system based on a scanning galvanometer, the confocal and annular total internal reflection dual-mode microscope system includes a light source and a movable first dichroic mirror, the first dichroic mirror is arranged on an optical path, and is used for transmitting excitation light and reflecting fluorescence; a first fluorescence detector is arranged on the reflective optical path of the first dichroic mirror; a two-dimensional scanning galvanometer, a mobile first mirror and a rotatable second mirror are arranged on the transmission optical path of the first dichroic mirror in turn; a mobile second dichroic mirror and a sample table on the reflective optical paths of the first mirror and the second mirror are arranged; a second fluorescent detector on the reflective optical path of the second mirror is also arranged; and a processing controller for controlling and processing is also arranged; the confocal and annular total internal reflection dual-mode microscope system has a laser scanning confocal microscope mode and an annular total internal reflection fluorescence microscope mode,the use efficiency of the system is improved, and the structure of the system is simplified.

Description

technical field [0001] The invention belongs to the field of super-resolution microscopic imaging, in particular to a scanning galvanometer-based confocal and annular total internal reflection dual-mode microscope system. Background technique [0002] In biological research, not only real-time imaging is required, but also high resolution is required, which puts high demands on the performance of the microscope. It is precisely because of this need that many researchers are committed to developing a super-resolution microscope that can break through the diffraction limit and can image in real time. The diffraction limit of fluorescence microscopy is limited by two optical path diffraction limits, namely, the diffraction limit of excitation light and the diffraction limit of emission light. To break through the diffraction limit, one can consider breaking through the diffraction limit of excitation light or breaking through the diffraction limit of emitted light. If the dif...

Claims

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Application Information

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IPC IPC(8): G01N21/64
CPCG01N21/6428
Inventor 匡翠方杨欣徐良李海峰刘旭张克奇毛磊
Owner ZHEJIANG UNIV
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