Supercharge Your Innovation With Domain-Expert AI Agents!

Microwave frequency measuring method and device based on frequency-phase slope mapping

A technology of microwave frequency measurement and phase slope, which is applied in the direction of frequency measurement device, frequency to phase shift conversion, etc., can solve the problems of limiting the measurement frequency range and non-monotonic mapping function, so as to avoid fuzzy problems, improve measurement accuracy and achieve low cost low effect

Active Publication Date: 2018-12-07
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
View PDF5 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Regardless of the above method, there is a fuzzy problem introduced by the non-monotonic mapping function, which limits the measurement frequency range [S.L.Pan and J.P.Yao, "Photonics-based broadband microwave measurement," J.Light.Technol., vol.35, no. 16, pp.3498-3513, Aug.2016.】

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Microwave frequency measuring method and device based on frequency-phase slope mapping
  • Microwave frequency measuring method and device based on frequency-phase slope mapping
  • Microwave frequency measuring method and device based on frequency-phase slope mapping

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] In order to solve the problem that the existing microwave frequency measurement technology cannot take into account the measurement accuracy and the complexity of the system structure, the basic idea of ​​the present invention is: the frequency to be measured is mapped to the phase difference slope, and the mapping from the frequency to the phase difference slope is a monotonic linear mapping. It can effectively solve the problem of fuzzy measurement, thereby greatly improving the measurement accuracy, and meanwhile, the system structure is simple and the implementation cost is low.

[0030] The microwave frequency measurement method based on the frequency-phase slope mapping of the present invention is specifically as follows: divide the microwave signal to be measured into two paths and introduce a delay difference that changes at a uniform speed between the two paths of microwave signals; then measure the delay difference after introducing the delay difference The tim...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a microwave frequency measuring method based on frequency-phase slope mapping. The method comprises the following steps: microwave signals to be tested are divided into two paths and delay difference which changes at a constant speed is introduced between the two paths of microwave signals; after the delay difference is introduced, slope of the phase difference between thetwo paths of microwave signals changing over time is measured; according to a monotonic linear mapping relationship between the slope and the frequency of the microwave signals to be tested, the frequency of the microwave signals to be tested is obtained. The invention also discloses a microwave frequency measuring device based on frequency-phase slope mapping. Compared with technologies of the prior art, the microwave frequency measuring method and device disclosed in the invention can help effectively prevent a problem of fuzziness in frequency measurement and improve frequency measurement accuracy, and a simple system structure and low implementation costs are realized.

Description

technical field [0001] The invention relates to a microwave frequency measuring method and device. Background technique [0002] Frequency is an important parameter of microwave signals, and the measurement of microwave frequency is a vital component of modern electronic systems, such as radar, communication and electronic warfare systems. With the development of electronic systems, their bandwidth is getting bigger and bigger, and the frequency range that the frequency measurement system can measure is also put forward higher and higher requirements. However, the traditional frequency measurement system based on electrical devices cannot meet the requirements of electronic application systems for frequency measurement bandwidth due to the limitation of the bandwidth of powered devices. [0003] With the development of modern microwave photonic technology, researchers have proposed many microwave frequency measurement systems based on microwave photonic technology. They use...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R23/12
Inventor 张方正史经展张道成潘时龙
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com