Low power consumption testing method for single stuck-at fault

Abstract

The embodiment of the invention provides a low power consumption testing method for a single stuck-at fault. The method comprises the steps of establishing a scan forest; placing the same scan chainsdriven by a demultiplexer in the same scan chain subset; placing the activated scan chain subset in a determination test signal; obtaining a primitive polynomial and additional variables required by all tests corresponding to a generated test set according to the test set, and generating a control vector used for controlling an SLFSR (Software-defined Linear Feedback Shift Register) according to the primitive polynomial and additional variables; moving the control vector into the SLFSR so as to configure the SLFSR into an SLFSR connected by the primitive polynomial; coding the determination test signal of the SLFSR; and compressing the coded determination test signal, and conducting a low power consumption test on the circuit according to the compressed determination test signal so as to obtain a test result. The embodiment of the invention is low in hardware overhead, reduces the energy consumption, does not bring additional delay overhead and is convenient for being widely applied inindustry.

Description

technical field [0001] Embodiments of the present invention relate to the field of integrated circuits, and more specifically, relate to a single fixed fault low power consumption testing method. Background technique [0002] As the size of integrated circuits increases, the gap between test functionality and test power consumption becomes wider and wider. At present, the functions of integrated circuits are becoming more and more complex, and the problem of overheating of chips has also emerged, and overheating of chips will shorten the life of products. However, due to the increase in random code exchange activity, the current test method requires more power consumption than the previous scan test method. [0003] The low power consumption test method in the prior art mainly reduces the power consumption by allowing automatic selection of a low power consumption pseudo-random test mode to reduce the switching activity of the scan switch. However, a large number of low-po...

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Problems solved by technology

In addition, the weighted pseudo-random test model can effectively improve the probability of failure stocks, but these methods usually lead to more energy consumption due to frequent scanning of flip-flops

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