A conduction test device

Abstract

The invention discloses a conducting test device, which comprises a conducting test frame, a connector contact assembly, a control module, a photoelectric coupler and a conducting result output module. A plurality of connector contact assemblies are arranged on the conducting test frame in a mutually parallel sliding way; one end of each connector contact assembly is a conductive end for electrically connecting a contact pin / jack at one end of the connector to be tested, and the other end is provided with a conductive pin electrically connected with the conductive end; one end of the input endof the photoelectric coupler is electrically connected with the conductive pin through a lead, and the other end of the input end of the photoelectric coupler is connected with the contact pin / jack at the other end of the connector to be tested after passing through a power supply through the lead; the control module judges whether the two ends of the input end of the corresponding photoelectriccoupler are conducted or not according to the output signal of the photoelectric coupler, further judges whether the contact pins / jacks at the two ends of the corresponding electric connector to be tested are conducted or not, and then outputs the corresponding conduction judgment result. The conducting test device can adapt to the conduction test of various types of connectors and improve the test efficiency and the test precision.

Description

technical field [0001] The invention relates to the technical field of connector performance detection, in particular to a continuity test device. Background technique [0002] During the production process of connectors, it is necessary to conduct electrical performance tests on their sockets and plugs. Nowadays, the development trend of connectors focuses on miniaturization, compactness and convenience, such as I / O socket pin spacing: 2mm×2mm, 1.524mm×1.778mm, 2.54mm×2.54mm, 1.25mm×1.25mm, 3.96mm×3.96mm, 5.08mm×5.08mm, 4.2mm×4.2mm. Therefore, the conduction detection standards for the pins of electronic products are becoming more and more stringent, and the technical requirements are getting higher and higher. [0003] Traditional test methods, such as multimeters or buzzer test tools to achieve point-to-point continuity testing, require a lot of manpower and operating time; when encountering connectors with dense pins or mass-produced connectors, one person is required ...

AI Technical Summary

Problems solved by technology

[0003] Traditional test methods, such as multimeters or buzzer test tools to achieve point-to-point continuity testing, require a lot of manpower and operating time; when encountering connectors with dense pins or mass-produced connectors, one person is required to assist in testing, and it is easy Temporary fatigue and dizziness of the tester's eyes, and low detection efficiency

In addition, the conduction confusion of adjacent pins caused by human factors such as improper operation by the tester increases unnecessary error factors and greatly reduces the accuracy and efficiency of the test.

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