A method to improve the electrical performance of algan/gan HEMT devices
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- 西安电子科技大学重庆集成电路创新研究院
- Publication Date
- 2020-09-08
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of semiconductors, and in particular relates to a method for improving the electrical performance of an AlGaN / GaN HEMT device. Background technique
[0002] Group III nitride materials are ideal materials for manufacturing high-voltage, high-temperature, and high-frequency electronic devices. Research on group III nitride materials has become the focus of widespread attention at home and abroad, and devices prepared from them are also widely used in national defense and aerospace, high-frequency broadband Communication, satellite remote sensing, radar and other military and civilian fields have broad application prospects.
[0003] The heterojunction of AlGaN / GaN HEMT devices has a large conduction band shift, and the heterointerface has a strong polarization effect, which can induce a large amount of interface charges and gather to form a high-density two-dimensional electron gas, making AlGaN / GaN HEMT de...