Single-particle transient effect evaluation method and system for high-speed digital-to-analog conversion circuit

Abstract

The invention discloses a single-particle transient effect evaluation method and a system for a high-speed digital-to-analog conversion circuit. The method comprises the following steps: (1) configuring a pattern for a high-speed digital-to-analog circuit to be tested, so that the high-speed digital-to-analog circuit to be tested outputs an analog signal according to the pattern; (2) collecting the analog signal and converting the signal into a digital signal, when the high-speed digital-to-analog circuit is judged to be in a normal working state according to the digital signal, executing step(3), otherwise, re-executing from step (1) until the circuit is in normal working condition; (3) performing a heavy ion test on the high-speed digital-to-analog circuit to re-acquire the analog signal output from the high-speed digital-to-analog circuit to be tested and perform analog-to-digital conversion, and comparing the converted digital signal with the pattern in step (1), if the differencebetween the two exceeds the set threshold, considering that a single-particle transient effect occurs in the high-speed digital-to-analog circuit to be tested; (4) performing error statistics on thesingle-particle transient effect of the high-speed digital-analog circuit to be tested during the heavy ion test; and (5) calculating an error interface T of the high-speed digital-to-analog circuit to be tested under the heavy ion, and using the T to evaluate the single-particle transient effect of the circuit.

Description

technical field [0001] The invention relates to a single-event transient effect evaluation method of a high-speed digital-to-analog conversion circuit based on an analog-to-digital conversion system. Said high speed is generally higher than 1 GHz. Background technique [0002] With the continuous development of digital signal processing technology and aerospace industry, high-speed digital-to-analog converters are widely used in space electronic systems. High-speed digital-to-analog converters are inevitably affected by the radiation of cosmic rays and high-energy particles when they are actually working in space, which can easily lead to deterioration of electrical performance. Therefore, it is necessary to build a radiation-resistant test system to test the single-event transient The effect is detected and its radiation resistance performance is evaluated. [0003] The high-speed digital-to-analog converter circuit is composed of different unit modules, and its single ev...

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Problems solved by technology

[0006] The technical problem solved by the present invention is to break through the existing single static test mode for the single event transient effect of the high-speed digital-to-analog conversion circuit, and propose a method for evaluating the single-event transient effect of the high-speed digital-to-analog conversion circuit based on the analog-to-digital conversion system and system, the method of the present invention solves the problem of inaccurate evaluation of single-event transient effects of digital-analog devices by existing evaluation methods in the dynamic test mode, and compared with the existing transient effect evaluation system, the operation method is convenient, Save a lot of machine time and manpower

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