Radio frequency delay line and test method thereof
A test method and delay line technology, applied in the field of electronic information, can solve the problems of manufacturing difficulties, long delay time and dispersion, and achieve the effects of improving accuracy, small passband reflection, and low passband loss
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0028] The present invention will be further described below in conjunction with drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention. In addition, it should be noted that, for the convenience of description, only some parts related to the present invention are shown in the accompanying drawings but not the whole content. Unless otherwise defined, all technical and scientific terms used herein are related to the technical field of the present invention. The skilled person generally understands the same meaning. The terms used herein are for describing specific embodiments only, and are not intended to limit the present invention.
[0029] Such as Figure 1A with Figure 1B As shown, the radio frequency delay line in this embodiment is a serpentine delay line, and the serpentine delay line is composed of microstrip lines arranged in a zigzag structu...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


