Plate glass defect rechecking system and rechecking method

A flat glass and defect technology, applied in the field of flat glass defect re-inspection system, can solve the problems of large size error of the re-inspection system and the inability to accurately detect the position of the defect, and achieve the effect of avoiding warping

Active Publication Date: 2019-04-16
IRICO DISPLAY DEVICES
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  • Abstract
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  • Application Information

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Problems solved by technology

The size error of the existing re-inspection system is too large, a

Method used

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  • Plate glass defect rechecking system and rechecking method
  • Plate glass defect rechecking system and rechecking method
  • Plate glass defect rechecking system and rechecking method

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Embodiment Construction

[0033] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0034] see figure 1 , the re-inspection system of the present invention is downstream of the conveyor line of the surface inspection system 1, and the re-inspection system includes a CCD probe 4, an X / Y transfer mechanism 5, a first laser sensor ranging system 11, and the first laser sensor ranging The system 11 includes a laser transmitter 6 and a photoelectric receiver 7; the X / Y direction transfer mechanism 5 is the supporting and moving driving mechanism of the entire re-inspection system, fixedly installed on the assembly line, and can move along the moving direction of the glass through the translation mechanism- The verticality of the X / Y transfer mechanism 5 is ≤2 / 10000; the X / Y transfer mechanism 5 is fixedly equipped with a CCD probe 4 and a laser emitter. The device 6 and the photoelectric receiver 7 are not in contact with each other; the CCD pro...

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Abstract

The invention discloses a plate glass defect rechecking system and rechecking method. The system comprises an X/Y directional transferring mechanism which can move along an X direction and a Y direction on a production line, wherein a CCD probe, a laser emitter and a photoelectric receiver are fixedly installed on the X/Y directional transferring mechanism, the laser emitter and the photoelectricreceiver are arranged on the two sides of the CCD probe correspondingly, and when a position of a defect is determined in the detection process, the laser emitter and the photoelectric receiver jointly confirm the focusing reference surface of the CCD probe, the CCD probe photographs N layers arranged of a plate glass, N photos are shot in total, the photo with the clearest defect is found out from the N photos, the defect position is determined, and then the follow-up process is carried out. According to the system, the defect position found through the system is high in precision, the shot photos can accurately reflect the size and other image characteristics of the defect, the defect can be accurately recognized conveniently, and manual intervention and re-judgment can be facilitated.

Description

【Technical field】 [0001] The invention belongs to the field of flat glass preparation and relates to a flat glass defect re-inspection system and re-inspection method. 【Background technique】 [0002] Flat glass has very strict quality requirements for defects. For example, the glass defect of G6 0.5mm substrate is less than or equal to 100um, the number of defects on the whole plate is less than or equal to 5, and the distance between any defects is greater than or equal to 300mm. The working surface layer of the glass substrate surface is not allowed to be solid Defects, internal solid defects are less than or equal to 100um. It is a complex task to classify flat glass defects through images. The defect size is in the micron level, and the optical deformation images are not much different. The defect classification is more complicated. [0003] In the process of producing flat glass by the overflow down-draw method, after the semi-finished flat glass is cut, ground and cle...

Claims

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Application Information

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IPC IPC(8): G01N21/958
CPCG01N21/958
Inventor 焦宗平梁中慧
Owner IRICO DISPLAY DEVICES
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