Method and device for reducing actual soft error rate of storage area of ​​ECC memory

A technology of soft error rate and storage area, applied in static memory, response error generation, error detection/correction, etc., can solve the problems of lack of storage area anti-soft error optimization design method, reduce soft error rate, etc., and achieve improved resistance Soft error capability, soft error rate reduction, and reliability enhancement effects

Active Publication Date: 2022-04-19
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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Problems solved by technology

[0005] Based on this, it is necessary to provide a method and device for reducing the actual soft error rate of the storage area of ​​the ECC memory in view of the current lack of an effective anti-soft error optimization design method for the storage area of ​​the ECC memory

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  • Method and device for reducing actual soft error rate of storage area of ​​ECC memory
  • Method and device for reducing actual soft error rate of storage area of ​​ECC memory
  • Method and device for reducing actual soft error rate of storage area of ​​ECC memory

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[0029] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.

[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for the purpose of descr...

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Abstract

The invention relates to a method and a device for reducing the actual soft error rate of a storage area of ​​an ECC memory. Provided is a method for reducing the actual soft error rate of the storage area of ​​the ECC memory, the method comprising: obtaining the functional relationship of the actual soft error rate of the storage area of ​​the ECC memory; determining and disassembling the storage architecture of the ECC memory according to the functional relationship The dismantling level k; according to the dismantling level k, determine the number of words in the storage area and the number of bits in a single word after the k-level dismantling of the storage architecture of the ECC memory; according to the functional relationship and the obtained dismantled storage area The number of words and the number of bits in a single word determine the actual soft error rate of the storage area of ​​the ECC memory after k-level disassembly. The above method disassembles a single word in the storage area into multiple words, reduces the soft error rate of the ECC memory, effectively improves the anti-soft error capability of the storage area of ​​the ECC memory, and enhances the reliability of the ECC memory.

Description

technical field [0001] The invention relates to the field of reliability of electronic devices, in particular to a method and a device for reducing the actual soft error rate of a storage area of ​​an ECC memory. Background technique [0002] Soft errors will occur during the use of the memory. The causes of soft errors include radiation particles (α particles, neutrons, protons, heavy ions, etc.), random noise, signal integrity problems, manufacturing or design defects, and critical units. When a soft error occurs, it will cause changes in the stored data in the memory, affecting the correctness of the output data, and further affecting the system operation. [0003] ECC (error correcting code) refers to adding some check bits on the basis of the original memory data bits to detect and correct soft errors. One of the most commonly used ECC codes is the Hamming code, which can realize the function of correcting one-bit errors and detecting two-bit errors, that is, "correcti...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/10G11C29/42G06F11/34
CPCG06F11/1048G06F11/3409G11C29/42
Inventor 张战刚雷志锋彭超何玉娟黄云恩云飞
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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