Scattering type low-temperature scanning near-field optical microscope

Abstract

The invention discloses a scattering type low-temperature scanning near-field optical microscope. The microscope includes a cold table, a sample scanning platform, a probe scanning platform, a parabolic mirror platform and a base, wherein the sample scanning platform and the probe scanning platform are arranged on the bottom of the cold table. The sample scanning platform includes a scanning table, an elastic clamp and a sample frame are arranged on the scanning table, and the sample frame is detachably clamped between the scanning table and the elastic clamp to facilitate replacement of samples. The probe scanning platform is located on one side opposite to the scanning platform, and includes a needle-tip coupling extraction platform connected with the bottom of the cold table, and a needle-tip bracket. A probe is fixed on the needle-tip bracket, the needle-tip bracket is connected with the needle-tip coupling extraction platform through magnetic suction and opposite to the scanning platform to facilitate replacement of the probe to scan the samples. The parabolic mirror platform is arranged on the base to converge outside laser to the probe and collect scattered light with sampleinformation to an external detector. The microscope can simultaneously achieve in-situ probe exchange and sample exchange, operation is simple and the compatibility is high.

Description

technical field [0001] The invention belongs to the technical field of near-field optical instruments, and in particular relates to a scattering low-temperature scanning near-field optical microscope. Background technique [0002] With the continuous advancement of modern micro-nano processing technology and scanning probe microscopy technology, near-field optical microscopes are also constantly developing, and near-field optical microscopes with various feedback forms and working methods appear. These near-field optical microscopes get near-field The resolution of optical images is relatively difficult to break through the diffraction limit of light, and the resulting resolution is relatively low. In order to further improve the resolution, scientists have obtained near-field optical images with a resolution of ~10nm or better by means of scattering through metallized AFM probes, thereby promoting research in the field of near-field optics. At the same time, Near-field ima...

AI Technical Summary

Problems solved by technology

[0003] However, at present, only one company is producing diffuse infrared or far-infrared near-field imaging systems that can obtain liquid helium temperature zones. The positioning of each platform, its working environment and vacuum degree did not meet the requirements of ultra-high vacuum, which is very inconvenient in scientific research application and actual operation, and also has a negative impact on experimental data

Images