Method, device and model for evaluating reliability of IGBT device in high-voltage direct-current circuit breaker
A high-voltage direct current, reliable technology, applied in the direction of instruments, special data processing applications, electrical digital data processing, etc., can solve the problems of low accuracy of evaluation results and high accuracy of reliability evaluation results
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0082] Embodiment 1 of the present invention provides a method for evaluating the reliability of IGBT devices in a high-voltage DC circuit breaker, wherein the high-voltage DC circuit breaker includes a transfer branch, and the transfer branch includes a semiconductor module. Embodiment 1 of the present invention is the transfer branch The reliability of the IGBT device of the semiconductor module is evaluated, and the specific flow chart of the embodiment of the present invention 1 is as follows image 3 As shown, the specific process is as follows:
[0083] S101: Substituting the obtained capacitor discharge curve into a pre-built simulation model to obtain evaluation parameters of the IGBT device of the semiconductor unit in the simulation model;
[0084] S102: Substituting the obtained current curve flowing through the IGBT device in the semiconductor module into a pre-built simulation model to obtain evaluation parameters of the IGBT device in the semiconductor module to ...
Embodiment 2
[0117] Based on the same inventive concept, Embodiment 2 of the present invention also provides a device for evaluating the reliability of IGBT devices in a high-voltage DC circuit breaker, including a first determination module, a second determination module, and an evaluation module, wherein the high-voltage DC circuit breaker includes a transfer branch , the transfer branch includes a semiconductor module; the functions of the determination module and the evaluation module are described in detail below:
[0118] Wherein the first determination module is used for substituting the obtained capacitor discharge curve into the pre-built simulation model to obtain the evaluation parameters of the IGBT device of the semiconductor unit in the simulation model;
[0119] The second determining module is used for substituting the obtained current curve flowing through the IGBT device in the semiconductor module into a pre-built simulation model to obtain evaluation parameters of the IG...
Embodiment 3
[0151] Embodiment 3 of the present invention provides a simulation model, such as Figure 4 , including a semiconductor unit, a discharge equivalent unit, an IGBT resistance unit and an IGBT thermal resistance unit; the discharge equivalent unit is connected to the semiconductor unit, and the semiconductor unit is connected to the IGBT thermal resistance unit through the IGBT resistance unit.
[0152] The discharge equivalent unit includes a capacitor C, an inductor L, a discharge switch S and a diode D connected in antiparallel with the discharge switch S;
[0153] The semiconductor unit includes IGBT1, IGBT2, diode D1, diode D2, diode D3, diode D4, diode D5, capacitor C1 and arrester BOD;
[0154] The anode of diode D1 is connected to common point A, and its cathode is connected to common point M; the cathode of diode D2 is connected to common point A, and its cathode is connected to common point N; the anode of diode D3 is connected to common point B, and its cathode is con...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


