Reliability enhancement structure for an SC PUF circuit and an enhancement method thereof

Abstract

The invention relates to the field of circuit design and information security. The invention discloses a reliability enhancement structure for an SC PUF circuit. The structure comprises a switch capacitor PUF array, a reliability test circuit, a PUF output register, a reliability identification register and a control logic generation module, a PUF unit comprises two capacitor sampling chains; thecapacitor sampling chain is connected with a latch-type sense amplifier through a sampling point; the negative electrode of a test capacitor is connected with a sampling point of a second capacitor sampling chain in each PUF unit through a first multi-way switch, the positive electrode of the test capacitor is respectively connected with a first port and a second port through a second multi-way switch, the first port is connected with a ground wire or a power supply through selection signals, and the second port is connected with the ground wire. The invention also discloses an enhancement method for the reliability enhancement structure of the SC PUF circuit. According to the reliability enhancement structure and method for the SC PUF circuit, the reliability of the output of the switchedcapacitor PUF is improved, so that the switched capacitor PUF can be directly applied to key generation without adopting any error correction mechanism.

Description

technical field [0001] The invention relates to the field of circuit design and information security, in particular to a reliability enhancement structure and enhancement method for SC PUF circuits. Background technique [0002] Switched-capacitor circuit (SC) PUF circuit is a new type of secure physically unclonable circuit (PUF). SC PUF realizes the physical unclonable function by sampling the manufacturing deviation of the metal capacitor. By covering the key parts of the chip with the metal transmission line network connected to the SC sampling circuit, it can effectively resist non-destructive detection attacks and reconstruction attacks. Therefore, SC PUF can be used to construct high-security key generation and storage circuits to protect the security of embedded systems. [0003] The basic structure of the switched capacitor PUF is as follows Figure 7 As shown, it consists of four modules: switched capacitor circuit (SC circuit), latch-style sense amplifier (Latch-...

AI Technical Summary

Problems solved by technology

[0005] However, since the PUF output will inevitably be affected by environmental factors (temperature, voltage, etc.), the reliability is not high. At present, various error correction mechanisms are mainly used to extract stable keys from PUF noise data, and the use of error correction mechanisms will Brings up some obvious problems:

[0006] 1) The error correction process requires a large execution overhead, which brings a great burden to the resource-constrained embedded system;

Images