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nvme front-end testing method, device, computer equipment and storage medium

A test method and test case technology, applied in the field of NVMe testing, can solve problems such as low test efficiency and cumbersomeness, and achieve the effect of convenient and fast testing and improving test efficiency.

Active Publication Date: 2022-06-03
SHENZHEN YILIAN INFORMATION SYST CO LTD
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  • Application Information

AI Technical Summary

Problems solved by technology

This test method needs to manually input test commands one by one in the terminal, and check the data in the chip storage area through DStream to verify the function of NVMe. Human judgment whether the test function meets expectations is too dependent on human operation, which is too cumbersome and the test efficiency is low.

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Embodiment Construction

[0058] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0059] It is to be understood that, when used in this specification and the appended claims, the terms "comprising" and "comprising" indicate the presence of the described features, integers, steps, operations, elements and / or components, but do not exclude one or The presence or addition of a number of other features, integers, steps, operations, elements, components, and / or sets thereof.

[0060] It is also to be understood that the...

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Abstract

The present invention relates to NVMe front-end test method, device, computer equipment and storage medium, and the method comprises obtaining the data of chip or FPGA; According to the data obtained, adopt register to test, form test case; Judge whether test case is tested successfully; If not, then Record the number of times the test case runs; obtain the reason and probability of the test case failure through machine learning; judge whether the number of times the test case runs reaches the preset threshold; if not, modify the configuration of the register according to the reason for the test case failure, and Return to obtain the data of the chip or FPGA; if so, obtain the test report of the test failure according to the test case and send it to the terminal. The invention realizes convenient and fast testing of the NVMe front end, and improves the testing efficiency.

Description

technical field [0001] The present invention relates to an NVMe test method, and more particularly to an NVMe front-end test method, device, computer equipment and storage medium. Background technique [0002] NVM Express (NVMe) or non-volatile memory host controller interface specification (Non-VolatileMemory express), is a logical device interface specification, based on the bus transmission protocol specification of the device logical interface (equivalent to the application layer in the communication protocol) , used to access non-volatile memory media attached via the PCI-Express (PCIe) bus. [0003] Before using NVMe, it is necessary to test the functions of the NVMe front-end to ensure smooth use. The existing methods for testing the functions of the NVMe front-end are based on such as figure 1 Implemented on the platform shown, when testing the function, the verifier takes over the FPGA (Field-Programmable Gate Array) or chip through the Dstream emulator, runs the t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22G06F11/263
CPCY02D10/00
Inventor 杨志佳冯元元冷志源
Owner SHENZHEN YILIAN INFORMATION SYST CO LTD
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