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Vector diagram test point selection method and device, storage medium and terminal

A technology of vector graphics and test points, applied in the field of data processing, can solve the problems of waste of manpower and material resources, insufficient manual point selection, and increase of point selection costs, so as to improve accuracy, improve selection efficiency and accuracy, and reduce test costs. Effect

Active Publication Date: 2019-06-21
SHENZHEN PARTNER INFORMATION TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of the above existing problems, the embodiment of the present invention provides a method and device, a storage medium and a terminal for selecting test points of vector diagrams, which can solve the problem that the manual selection of vector diagram points in the prior art is not comprehensive enough, wastes manpower and material resources, and increases the number of selected points. point cost technical issues

Method used

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  • Vector diagram test point selection method and device, storage medium and terminal
  • Vector diagram test point selection method and device, storage medium and terminal
  • Vector diagram test point selection method and device, storage medium and terminal

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Embodiment 1

[0033] This embodiment provides a method for selecting a test point of a vector diagram, which is applicable to the situation where the position of the test point of the object is determined through the vector diagram of the object. The method for selecting a vector diagram test point provided in this embodiment may be executed by a device for selecting a vector diagram test point, and the device may be implemented by software and / or hardware. figure 1 It is a flow chart of a method for selecting test points of a vector diagram provided by Embodiment 1 of the present invention. Such as figure 1 As shown, the method includes:

[0034] S110. Acquire structural parameters of the vector diagram; the structural parameters include positions and outlines of elements in the vector diagram.

[0035] Specifically, a vector diagram is an object-oriented image drawn according to geometric characteristics, and is applicable to graphic design, text and logo design, layout design, and the ...

Embodiment 2

[0051] This embodiment is optimized on the basis of the above embodiments, and provides a specific method for constructing a connected layout, specifically: determining the position and location of each element of each line layer in the vector diagram according to the structural parameters Contour; determine the relative position and connection position of each line layer in the vector diagram according to the structural parameters; construct a plane connected layout according to the position and outline of each element of each line layer; according to the plane The connection layout and the relative position and connection position of each layer of the line layer are used to construct a three-dimensional connection layout. Figure 4 It is a flowchart of a method for selecting test points of a vector diagram provided by Embodiment 2 of the present invention. Such as Figure 4 As shown, the method includes:

[0052] S410. Acquire structural parameters of the vector diagram; t...

Embodiment 3

[0068] This embodiment is optimized on the basis of the above-mentioned embodiments, and provides a specific process of executing the touring task, specifically: according to the connected layout, determine the execution fulcrum of the touring task, and mark the execution fulcrum on the execution fulcrum the travel mark; when there is an execution line connected to the execution fulcrum in the connected layout, judge whether the execution line is marked with the travel mark; if not, execute the travel task, and in the connected layout The travel mark is marked on the execution route; if yes, the execution fulcrum of the travel task is re-determined. Figure 5 It is a flowchart of a method for executing a vector map tour task provided by Embodiment 3 of the present invention. Such as Figure 5 As shown, the method includes:

[0069] S510. Determine an execution fulcrum of the travel task according to the connected layout, and mark the travel mark on the execution fulcrum.

[0...

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PUM

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Abstract

The embodiment of the invention discloses a vector diagram test point selection method and device, a storage medium and a terminal. By obtaining structural parameters of a vector diagram, a connectedlayout of the vector diagram is constructed. According to a preset logic route, a tourist mark is performed when a tourist task is executed on the connected layout to determine the position of the test point of the vector diagram, thereby simplifying the selection mode of the test point, reducing the test times, improving the selection efficiency and accuracy of the test point, further reducing the subsequent test difficulty, improving the accuracy of the test result, and reducing the test cost.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of data processing, in particular to a method and device for selecting test points of a vector diagram, a storage medium, and a terminal. Background technique [0002] Lines, circles, rectangles, curves, charts and other elements form graphics, and the interweaving of each element can form a vector diagram. The vector diagram may be a plane vector diagram composed of planar contour lines in a two-dimensional space, or a three-dimensional vector diagram composed of interwoven multi-layer structures in a three-dimensional space. The vector diagram can be, for example, a construction engineering drawing, a component diagram, a circuit diagram of a printed circuit board, and other engineering and equipment circuit diagrams. [0003] The structure, quantity, and interweaving mode of each component element in the vector diagram can reflect the structural characteristics of the actual obj...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCY02D10/00
Inventor 马芹杰曾波刘静蒋小东
Owner SHENZHEN PARTNER INFORMATION TECH