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Sample test method and device for material deformation analysis

A technology of a testing device and a testing method, which is applied to measurement devices, optical devices, and testing of machine/structural components, etc., can solve problems such as difficulty in free-surface velocity curves, and achieve the effect of good curve quality.

Inactive Publication Date: 2019-07-16
SOUTHWEST JIAOTONG UNIV
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

However, for flat plate impact experiments of inhomogeneous materials, it is difficult to measure the free surface velocity curves at different positions of the sample under the same loading conditions

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  • Sample test method and device for material deformation analysis
  • Sample test method and device for material deformation analysis
  • Sample test method and device for material deformation analysis

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Embodiment Construction

[0055] The present invention will be clearly and completely described below in conjunction with the accompanying drawings. Those skilled in the art will be able to implement the present invention based on these descriptions. Before the present invention is described in conjunction with the accompanying drawings, it should be pointed out that:

[0056]The technical solutions and technical features provided in each part of the present invention, including the following description, can be combined with each other under the condition of no conflict.

[0057] In addition, the embodiments of the present invention referred to in the following description are generally only a part of the embodiments of the present invention, rather than all the embodiments. Therefore, based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[00...

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Abstract

The invention relates to the field of material testing, in particular to a sample test method and device for material deformation analysis. The sample test method for material deformation analysis comprises the following operations of receiving lasers of different frequencies at different positions on the free surface of the sample, and obtaining the free surface information of the sample by an optical fiber Doppler velocity-measuring system; when the sample is subjected to impact loading, obtaining the signal change information on the free surface of the sample; and analyzing the signal change information. Thus, the effective combination of the optical hybrid fiber can better obtain the deformation evolution of the non-uniform material at a high strain rate. The sample test device comprises a light gas gun, a sample stage, a velocity measuring device, a light sensor, a first laser and a second laser, wherein the light sensor is electrically connected with a second oscilloscope, and the second oscilloscope is connected to a first oscilloscope. In this way, the free surface velocity curve of the material at different positions can be intuitively obtained, which further makes a breakthrough in material testing.

Description

technical field [0001] The patent of the present invention relates to the field of material testing, in particular to a sample testing method and device for material deformation analysis. Background technique [0002] The study of the dynamic response of materials under impact loading is a very complex field. This field not only involves multiple disciplines such as physics, mechanics, and materials science, but also includes multiple scales such as macroscopic, mesoscopic, and microscopic. This field is an important part not only of shock wave physics but also of solid mechanics. As an analysis method developed rapidly in recent years, light gas cannon technology can fully reflect the mechanical behavior of materials under high strain rates, and mainly analyze the properties of materials through the measured free surface velocity curves. The current test method is to use an optical fiber corresponding to the free surface velocity curve of a point of the test sample. Howe...

Claims

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Application Information

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IPC IPC(8): G01N3/30G01M7/08G01B11/16
CPCG01N3/30G01M7/08G01B11/16
Inventor 陈坤洋叶世佳卢磊蔡洋罗胜年
Owner SOUTHWEST JIAOTONG UNIV
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