Testing method of contact heat resistance between circular section one-dimensional nanostructures
A nano-structure, circular cross-section technology, applied in the field of thermophysical parameter testing of solid materials, can solve the problems of high sample quality consistency requirements, easy damage or loss of samples, and reduced test success rate, so as to improve the test success rate and improve Measurement accuracy, effect of reducing requirements
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[0042] In the test scheme for the contact thermal resistance between the circular cross-section one-dimensional nanostructures disclosed in the present invention, the adopted test technique is the thermal bridge method. The present invention will be further described in detail below with reference to the drawings and implementation examples.
[0043] figure 1 The principle diagram of the thermal bridge method to test the thermal properties of one-dimensional nanostructures is given. The method uses a suspended micro device prepared by the MEMS process, including a suspended heat source 1 and a heat sink 7, a plurality of first suspended arms 3 supporting the heat source, a plurality of second suspended arms 5 supporting the heat sink, and a substrate 4. The first micro-coil 2 and the second micro-coil 6 are respectively made on the heat source 1 and the heat sink 7, wherein the first micro-coil 2 serves as a heater and a temperature sensor to heat the heat source and detect the ...
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