Single-event latch-up limiting current test method, device and system

Abstract

The invention relates to a single-event latch-up limiting current test method, device and system. The method comprises the following steps: when monitoring a single-event latch-up effect appears to ato-be-tested device in current ion beam irradiation, taking a single-event latch-up maintaining current as an initial value of the input current of the to-be-tested device to gradually reduce the input current; recording the duration that the to-be-tested device exits from the single-event latch-up effect under the input currents; according to the input currents and the duration, establishing a current duration curve of the to-be-tested device in the current ion beam irradiation; acquiring a current duration curve corresponding to the to-be-tested device in the next ion beam irradiation; according to the current duration curves and tolerable interruption duration of the to-be-tested device, acquiring corresponding limited currents of the to-be-tested device in the various kinds of ion beamirradiation, and confirming the minimum value in the limited currents as the single-event latch-up limiting current of the to-be-tested device; thus, the accuracy of testing the single-event latch-uplimiting current is improved.

Description

technical field [0001] The present application relates to the technical field of reliability of electronic devices, in particular to a single event latch-up limiting current testing method, device and system. Background technique [0002] When a spacecraft is operating in a harsh space radiation environment, particles such as galactic cosmic rays, solar cosmic rays, and high-energy heavy ions and protons in the trapping belt of the geomagnetic field in the environment will produce single event effects in the electronic system of the spacecraft, resulting in serious Threat to the normal operation of space vehicles. According to the statistics of the National Geophysical Data Center of the United States, from 1971 to 1986, the total number of failures caused by various reasons in the 39 geostationary satellites launched by the United States was 1589 times, among which the single event upset (Single Event Upset, SEU) caused by radiation ) caused 621 faults, accounting for 39% ...

AI Technical Summary

Problems solved by technology

[0003] The single event effect brought by space radiation has increasingly become a bottleneck problem restricting the application of space vehicles. Once a single event effect occurs, it may permanently damage or burn the electronic devices of the space vehicle. For example, the single event latch in the single event effect will make electronic devices A low-impedance and high-current path is formed between the power supply and the ground, which causes the circuit to fail to work normally or even fail. Therefore, it is necessary to study the impact of the single event latch-up effect on the spacecraft, and to propose means that can suppress the single-event latch-up effect, such as , the use of limiting current is a commonly used method. However, in the process of implementation, the inventors found that there are at least the following problems in the traditional technology: the traditional technology cannot accurately test the single event latch-up current limiting, and cannot be used for optimizing electronic device design. Provide data support

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