Unit test framework suitable for embedded system

Abstract

The invention provides a unit test framework suitable for an embedded system. The unit test framework is used for solving the problem of standardized test of application programs in the current embedded field. The unit test framework comprises a standard test interface module, a test case exporting module, a test command analyzing module, a test unit executing module, a log module and a test result processing module. The test case exporting module abstracts a test case program into a test initialization module, a test cleaning module and a test case program entry module, and exports the test case program to a code segment specified in a program mirror image by utilizing the characteristics of a linker. The unit test framework is compiled by using a standard C language, so that a universal test interface is realized, the difficulty in compiling a test case program is reduced, the code reuse degree is improved, the development period is shortened, and the unit test framework is suitable for all embedded operation systems and can be transplanted to a bare computer system without using the embedded system for use.

Description

technical field [0001] The invention relates to the field of embedded software testing, in particular to a testing method and a testing system applied to a unit testing framework of an embedded system. Background technique [0002] With the rapid development of computer technology and the rapid rise of Internet of Things technology, the iteration speed of embedded software and hardware is getting faster and faster, which puts forward higher requirements for embedded software quality and system stability. Since embedded systems usually use real-time operating systems or bare-metal systems with limited memory, the C language unit test framework on general-purpose computer software cannot be applied to embedded software testing. Because there is no general test framework for embedded software testing, it is impossible to write reusable general test case programs, and the test coverage is low. Contents of the invention [0003] In view of the problems existing in the prior ar...

AI Technical Summary

Problems solved by technology

[0005] (1) The standard test interface module is realized abstractly, which facilitates the realization of a general-purpose test case program with a unified style, and solves the problem that the existing tests do not have a unified structure and test result judgment method;

Images